X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.7
Temperature 293.0
Details 4% (w/v) PEG8000, 100 mM Tris pH 8.7, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 133.92 α = 90
b = 133.92 β = 90
c = 85.56 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2011-06-30
Diffraction Radiation
Monochromator Protocol
MD2 micro-diffractometer SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97918 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 99.3 -- -- -- -- 31038 30831 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.69 99.0 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.5001 36.051 -- 0.0 30924 30674 1541 99.19 0.1998 0.1998 0.197 0.2548 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5001 2.5807 -- 139 2585 0.3044 0.4049 -- 98.0
X Ray Diffraction 2.5807 2.6729 -- 137 2604 0.2734 0.3297 -- 99.0
X Ray Diffraction 2.6729 2.7799 -- 133 2653 0.2548 0.3061 -- 99.0
X Ray Diffraction 2.7799 2.9064 -- 149 2592 0.2424 0.3685 -- 99.0
X Ray Diffraction 2.9064 3.0596 -- 149 2649 0.2512 0.3502 -- 99.0
X Ray Diffraction 3.0596 3.2511 -- 134 2629 0.2377 0.305 -- 99.0
X Ray Diffraction 3.2511 3.502 -- 152 2629 0.2252 0.2675 -- 100.0
X Ray Diffraction 3.502 3.854 -- 128 2665 0.201 0.2705 -- 100.0
X Ray Diffraction 3.854 4.4108 -- 141 2666 0.1777 0.2342 -- 99.0
X Ray Diffraction 4.4108 5.5539 -- 151 2681 0.1642 0.2124 -- 100.0
X Ray Diffraction 5.5539 36.0543 -- 128 2780 0.1851 0.2315 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -5.7072
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -5.7072
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 11.4145
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.071
f_dihedral_angle_d 17.004
f_angle_d 1.286
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4921
Nucleic Acid Atoms 0
Heterogen Atoms 35
Solvent Atoms 240

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHARP Structure Solution
PHENIX (phenix.refine: 1.7.3_928) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.3_928) refinement
SHARP model building
HKL-2000 data collection