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X-RAY DIFFRACTION
Materials and Methods page
4ILX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 298.0
    Details 1.6M sodium citrate tris buffer pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.38 α = 90
    b = 41.35 β = 104.1
    c = 72.1 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU RAXIS IV++
    Collection Date 2011-02-09
     
    Diffraction Radiation
    Monochromator varimax optics
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH3R
    Wavelength List 1.5
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.6
    Resolution(Low) 50
    Percent Possible(Observed) 91.7
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.66
    Percent Possible(All) 87.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6
    Resolution(Low) 26.699
    Cut-off Sigma(F) 1.4
    Number of Reflections(all) 29545
    Number of Reflections(Observed) 29545
    Number of Reflections(R-Free) 1506
    Percent Reflections(Observed) 91.67
    R-Factor(All) 0.1505
    R-Factor(Observed) 0.1505
    R-Work 0.1487
    R-Free 0.1846
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6
    Shell Resolution(Low) 1.6514
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2399
    R-Factor(R-Work) 0.1436
    R-Factor(R-Free) 0.1957
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6514
    Shell Resolution(Low) 1.7104
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2432
    R-Factor(R-Work) 0.1418
    R-Factor(R-Free) 0.1836
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7104
    Shell Resolution(Low) 1.7789
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2432
    R-Factor(R-Work) 0.146
    R-Factor(R-Free) 0.1934
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7789
    Shell Resolution(Low) 1.8598
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2484
    R-Factor(R-Work) 0.139
    R-Factor(R-Free) 0.1967
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8598
    Shell Resolution(Low) 1.9579
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2502
    R-Factor(R-Work) 0.1359
    R-Factor(R-Free) 0.1841
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9579
    Shell Resolution(Low) 2.0805
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.1384
    R-Factor(R-Free) 0.1563
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0805
    Shell Resolution(Low) 2.241
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.1433
    R-Factor(R-Free) 0.179
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.241
    Shell Resolution(Low) 2.4664
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1476
    R-Factor(R-Free) 0.1719
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4664
    Shell Resolution(Low) 2.823
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1558
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.823
    Shell Resolution(Low) 3.5553
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1467
    R-Factor(R-Free) 0.1774
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5553
    Shell Resolution(Low) 26.7028
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.1601
    R-Factor(R-Free) 0.1996
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.079
    f_dihedral_angle_d 16.324
    f_angle_d 1.135
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2049
    Nucleic Acid Atoms 0
    Heterogen Atoms 41
    Solvent Atoms 257
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection HKL-2000