X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 298.0
Details 1.6M sodium citrate tris buffer pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 42.38 α = 90
b = 41.35 β = 104.1
c = 72.1 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU RAXIS IV++ -- 2011-02-09
Diffraction Radiation
Monochromator Protocol
varimax optics SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R 1.5 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 50 91.7 -- -- -- -- -- n/a 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.66 87.1 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.6 26.699 -- 1.4 29545 29545 1506 91.67 0.1505 0.1505 0.1487 0.1846 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6 1.6514 -- 116 2399 0.1436 0.1957 -- 87.0
X Ray Diffraction 1.6514 1.7104 -- 131 2432 0.1418 0.1836 -- 88.0
X Ray Diffraction 1.7104 1.7789 -- 143 2432 0.146 0.1934 -- 89.0
X Ray Diffraction 1.7789 1.8598 -- 135 2484 0.139 0.1967 -- 90.0
X Ray Diffraction 1.8598 1.9579 -- 140 2502 0.1359 0.1841 -- 91.0
X Ray Diffraction 1.9579 2.0805 -- 123 2558 0.1384 0.1563 -- 92.0
X Ray Diffraction 2.0805 2.241 -- 149 2558 0.1433 0.179 -- 93.0
X Ray Diffraction 2.241 2.4664 -- 137 2609 0.1476 0.1719 -- 94.0
X Ray Diffraction 2.4664 2.823 -- 137 2660 0.1558 0.1857 -- 95.0
X Ray Diffraction 2.823 3.5553 -- 127 2692 0.1467 0.1774 -- 96.0
X Ray Diffraction 3.5553 26.7028 -- 168 2713 0.1601 0.1996 -- 95.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.079
f_dihedral_angle_d 16.324
f_angle_d 1.135
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2049
Nucleic Acid Atoms 0
Heterogen Atoms 41
Solvent Atoms 257

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASER model building
HKL-2000 data collection