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X-RAY DIFFRACTION
Materials and Methods page
4ILH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 277.0
    Details 0.1 M Tris-HCl, pH 8.0, 19 % (w/v) PEG 4000 and 100 mM KCl, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.89 α = 90
    b = 76.76 β = 105.88
    c = 91.86 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Collection Date 2012-04-17
     
    Diffraction Radiation
    Monochromator Si-111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.9184
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.85
    Resolution(Low) 35
    Number Reflections(All) 45624
    Number Reflections(Observed) 45500
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.08
    Redundancy 3.4
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.9
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.88
    Mean I Over Sigma(Observed) 2.0
    R-Sym I(Observed) 0.74
    Redundancy 3.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.85
    Resolution(Low) 33.953
    Number of Reflections(all) 45624
    Number of Reflections(Observed) 45497
    Number of Reflections(R-Free) 2275
    Percent Reflections(Observed) 99.8
    R-Factor(All) 0.1703
    R-Factor(Observed) 0.1703
    R-Work 0.1679
    R-Free 0.2174
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 13.4365
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -7.0709
    Anisotropic B[2][2] 6.4617
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 8.8554
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.85
    Shell Resolution(Low) 1.8902
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.263
    R-Factor(R-Free) 0.3516
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8902
    Shell Resolution(Low) 1.9342
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.241
    R-Factor(R-Free) 0.2841
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9342
    Shell Resolution(Low) 1.9826
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2771
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9826
    Shell Resolution(Low) 2.0362
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2045
    R-Factor(R-Free) 0.2928
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0362
    Shell Resolution(Low) 2.0961
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.2856
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0961
    Shell Resolution(Low) 2.1637
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1875
    R-Factor(R-Free) 0.2397
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1637
    Shell Resolution(Low) 2.241
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.241
    Shell Resolution(Low) 2.3308
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.2492
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3308
    Shell Resolution(Low) 2.4368
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2398
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4368
    Shell Resolution(Low) 2.5652
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1697
    R-Factor(R-Free) 0.2137
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5652
    Shell Resolution(Low) 2.7259
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.1822
    R-Factor(R-Free) 0.2353
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7259
    Shell Resolution(Low) 2.9363
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2729
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.239
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9363
    Shell Resolution(Low) 3.2315
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1623
    R-Factor(R-Free) 0.1841
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2315
    Shell Resolution(Low) 3.6987
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.1432
    R-Factor(R-Free) 0.1653
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6987
    Shell Resolution(Low) 4.658
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1295
    R-Factor(R-Free) 0.1809
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.658
    Shell Resolution(Low) 33.9582
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.1885
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.08
    f_dihedral_angle_d 15.056
    f_angle_d 1.157
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4515
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 513
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection MAR345dtb