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X-RAY DIFFRACTION
Materials and Methods page
4IJQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 291.0
    Details 0.2M LiSO4, 30% PEG5000MME, 0.1M Tris-HCl, 0.88mM ligand, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.51 α = 90
    b = 127.74 β = 102.01
    c = 64.76 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Collection Date 2011-12-09
     
    Diffraction Radiation
    Monochromator Si
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX1
    Wavelength List 0.95
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2
    Resolution(Low) 19.87
    Number Reflections(All) 59187
    Number Reflections(Observed) 59187
    Percent Possible(Observed) 98.3
    R Merge I(Observed) 0.102
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.004
    Resolution(Low) 19.867
    Cut-off Sigma(F) 0.01
    Number of Reflections(Observed) 56605
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 94.12
    R-Factor(Observed) 0.1751
    R-Work 0.1734
    R-Free 0.2226
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.0634
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.4428
    Anisotropic B[2][2] -3.9473
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.923
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.004
    Shell Resolution(Low) 2.0751
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 4522
    R-Factor(R-Work) 0.2588
    R-Factor(R-Free) 0.287
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0751
    Shell Resolution(Low) 2.1581
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 5233
    R-Factor(R-Work) 0.2085
    R-Factor(R-Free) 0.2745
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1581
    Shell Resolution(Low) 2.2562
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 5419
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2562
    Shell Resolution(Low) 2.375
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 5460
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2584
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.375
    Shell Resolution(Low) 2.5235
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 5536
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2517
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5235
    Shell Resolution(Low) 2.7179
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 5642
    R-Factor(R-Work) 0.1827
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7179
    Shell Resolution(Low) 2.9906
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 5680
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2384
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9906
    Shell Resolution(Low) 3.4214
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 5701
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.2398
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4214
    Shell Resolution(Low) 4.3034
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 5728
    R-Factor(R-Work) 0.1454
    R-Factor(R-Free) 0.1646
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3034
    Shell Resolution(Low) 19.868
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 5684
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.1995
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.09
    f_dihedral_angle_d 16.574
    f_angle_d 1.287
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6401
    Nucleic Acid Atoms 0
    Heterogen Atoms 136
    Solvent Atoms 284
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASES
    data collection ADSC version: Quantum