POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4IJM
  •   Crystallization Hide
    Crystallization Experiments
    Method EVAPORATION
    pH 5
    Temperature 292.0
    Details 0.1 M sodium acetate, 1 M sodium formate, pH 5, EVAPORATION, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 131.36 α = 90
    b = 134.47 β = 90
    c = 203.94 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 110
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2009-12-09
     
    Diffraction Radiation
    Monochromator diamond(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-G
    Wavelength List 0.97586
    Site APS
    Beamline 21-ID-G
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 3.35
    Resolution(Low) 30
    Number Reflections(All) 52534
    Number Reflections(Observed) 52376
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.056
    Redundancy 6.6
     
    High Resolution Shell Details
    Resolution(High) 3.35
    Resolution(Low) 3.41
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.649
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.352
    Resolution(Low) 29.958
    Cut-off Sigma(F) 1.33
    Number of Reflections(Observed) 52342
    Number of Reflections(R-Free) 2661
    Percent Reflections(Observed) 99.84
    R-Factor(All) 0.22
    R-Factor(Observed) 0.2192
    R-Work 0.2169
    R-Free 0.2607
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.352
    Shell Resolution(Low) 3.4132
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2530
    R-Factor(R-Work) 0.2696
    R-Factor(R-Free) 0.3133
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4132
    Shell Resolution(Low) 3.4788
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.2494
    R-Factor(R-Free) 0.2751
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4788
    Shell Resolution(Low) 3.5497
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.2377
    R-Factor(R-Free) 0.2781
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5497
    Shell Resolution(Low) 3.6267
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.238
    R-Factor(R-Free) 0.2921
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6267
    Shell Resolution(Low) 3.7109
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.2937
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7109
    Shell Resolution(Low) 3.8036
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.2842
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8036
    Shell Resolution(Low) 3.9062
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.2301
    R-Factor(R-Free) 0.2716
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9062
    Shell Resolution(Low) 4.0209
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.2233
    R-Factor(R-Free) 0.2987
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0209
    Shell Resolution(Low) 4.1503
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.2096
    R-Factor(R-Free) 0.2792
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1503
    Shell Resolution(Low) 4.2983
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2833
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2983
    Shell Resolution(Low) 4.4698
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.205
    R-Factor(R-Free) 0.2648
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4698
    Shell Resolution(Low) 4.6725
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6725
    Shell Resolution(Low) 4.9179
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.1935
    R-Factor(R-Free) 0.2484
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9179
    Shell Resolution(Low) 5.2245
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.2723
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2245
    Shell Resolution(Low) 5.6254
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.2216
    R-Factor(R-Free) 0.2667
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6254
    Shell Resolution(Low) 6.187
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.2355
    R-Factor(R-Free) 0.2904
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.187
    Shell Resolution(Low) 7.072
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2674
    R-Factor(R-Work) 0.2391
    R-Factor(R-Free) 0.2777
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.072
    Shell Resolution(Low) 8.8714
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.2227
    R-Factor(R-Free) 0.2506
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.8714
    Shell Resolution(Low) 29.9588
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.199
    R-Factor(R-Free) 0.2183
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.046
    f_dihedral_angle_d 15.251
    f_angle_d 0.71
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 23403
    Nucleic Acid Atoms 0
    Heterogen Atoms 419
    Solvent Atoms 397
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building CNS
    data collection HKL-2000