POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4IIL
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    Temperature 298.0
    Details 0.2 M KSCN, 20% PEG3350, vapor diffusion, hanging drop, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.96 α = 90
    b = 107.79 β = 90
    c = 72.88 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-06-15
     
    Diffraction Radiation
    Monochromator Si111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97926
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.3
    Resolution(Low) 50
    Number Reflections(Observed) 73370
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.054
    Redundancy 5.8
     
    High Resolution Shell Details
    Resolution(High) 1.3
    Resolution(Low) 1.32
    Percent Possible(All) 98.9
    R Merge I(Observed) 0.614
    Redundancy 4.3
    Number Unique Reflections(All) 3604
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.3
    Resolution(Low) 26.294
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 73351
    Number of Reflections(R-Free) 3698
    Percent Reflections(Observed) 99.55
    R-Factor(Observed) 0.1222
    R-Work 0.1206
    R-Free 0.1528
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 15.3787
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3
    Shell Resolution(Low) 1.3165
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2412
    R-Factor(R-Work) 0.2334
    R-Factor(R-Free) 0.2804
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3165
    Shell Resolution(Low) 1.3345
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.181
    R-Factor(R-Free) 0.2234
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3345
    Shell Resolution(Low) 1.3535
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.2062
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3535
    Shell Resolution(Low) 1.3738
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.129
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3738
    Shell Resolution(Low) 1.3952
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.1245
    R-Factor(R-Free) 0.1741
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3952
    Shell Resolution(Low) 1.4181
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.121
    R-Factor(R-Free) 0.1841
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4181
    Shell Resolution(Low) 1.4425
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.1175
    R-Factor(R-Free) 0.1678
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4425
    Shell Resolution(Low) 1.4688
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1141
    R-Factor(R-Free) 0.1534
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4688
    Shell Resolution(Low) 1.497
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1138
    R-Factor(R-Free) 0.1565
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.497
    Shell Resolution(Low) 1.5276
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.094
    R-Factor(R-Free) 0.1365
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5276
    Shell Resolution(Low) 1.5608
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.0906
    R-Factor(R-Free) 0.1469
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5608
    Shell Resolution(Low) 1.5971
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.0909
    R-Factor(R-Free) 0.1411
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5971
    Shell Resolution(Low) 1.637
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.0905
    R-Factor(R-Free) 0.1399
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.637
    Shell Resolution(Low) 1.6813
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.0929
    R-Factor(R-Free) 0.1342
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6813
    Shell Resolution(Low) 1.7307
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.0936
    R-Factor(R-Free) 0.1694
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7307
    Shell Resolution(Low) 1.7866
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.0936
    R-Factor(R-Free) 0.1319
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7866
    Shell Resolution(Low) 1.8504
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.1001
    R-Factor(R-Free) 0.1527
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8504
    Shell Resolution(Low) 1.9245
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.1012
    R-Factor(R-Free) 0.1442
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9245
    Shell Resolution(Low) 2.0121
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1018
    R-Factor(R-Free) 0.1427
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0121
    Shell Resolution(Low) 2.1181
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1
    R-Factor(R-Free) 0.1456
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1181
    Shell Resolution(Low) 2.2507
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1008
    R-Factor(R-Free) 0.135
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2507
    Shell Resolution(Low) 2.4244
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1142
    R-Factor(R-Free) 0.132
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4244
    Shell Resolution(Low) 2.6682
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1253
    R-Factor(R-Free) 0.1481
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6682
    Shell Resolution(Low) 3.0537
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2724
    R-Factor(R-Work) 0.1341
    R-Factor(R-Free) 0.1543
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0537
    Shell Resolution(Low) 3.8455
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.1342
    R-Factor(R-Free) 0.1545
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8455
    Shell Resolution(Low) 26.294
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2808
    R-Factor(R-Work) 0.1537
    R-Factor(R-Free) 0.1604
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.757
    f_plane_restr 0.007
    f_chiral_restr 0.075
    f_angle_d 1.295
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2456
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 350
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCollect
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL