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X-RAY DIFFRACTION
Materials and Methods page
4II3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 291.0
    Details 0.1M Sodium Cacodylate, 0.2M Calcium Acetate, 11.5% Peg8000, 3% 1,5 diaminopentane, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 180.5 α = 90
    b = 113.3 β = 90
    c = 126.6 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 108
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315
    Collection Date 2012-04-16
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.979
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.9
    Resolution(Low) 50
    Number Reflections(All) 57810
    Number Reflections(Observed) 55035
    Percent Possible(Observed) 95.2
    R Merge I(Observed) 0.113
    Redundancy 3.4
     
    High Resolution Shell Details
    Resolution(High) 2.9
    Resolution(Low) 3.0
    Percent Possible(All) 89.4
    R Merge I(Observed) 0.397
    Redundancy 2.4
    Number Unique Reflections(All) 5094
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.9
    Resolution(Low) 50.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 58242
    Number of Reflections(Observed) 55008
    Number of Reflections(R-Free) 2770
    Percent Reflections(Observed) 94.4
    R-Factor(All) 0.2392
    R-Factor(Observed) 0.2392
    R-Work 0.2392
    R-Free 0.2829
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 61.8011
    Anisotropic B[1][1] -4.782
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.663
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.119
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9
    Shell Resolution(Low) 3.0
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 4473
    R-Factor(R-Work) 0.3887
    R-Factor(R-Free) 0.381
    Percent Reflections(Observed) 81.5
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0
    Shell Resolution(Low) 3.12
    Number of Reflections(R-Free) 281
    Number of Reflections(R-Work) 4907
    R-Factor(R-Work) 0.3616
    R-Factor(R-Free) 0.3867
    Percent Reflections(Observed) 90.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.12
    Shell Resolution(Low) 3.27
    Number of Reflections(R-Free) 279
    Number of Reflections(R-Work) 5068
    R-Factor(R-Work) 0.3349
    R-Factor(R-Free) 0.3754
    Percent Reflections(Observed) 92.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.27
    Shell Resolution(Low) 3.44
    Number of Reflections(R-Free) 285
    Number of Reflections(R-Work) 5156
    R-Factor(R-Work) 0.2998
    R-Factor(R-Free) 0.348
    Percent Reflections(Observed) 94.1
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.44
    Shell Resolution(Low) 3.65
    Number of Reflections(R-Free) 269
    Number of Reflections(R-Work) 5218
    R-Factor(R-Work) 0.2661
    R-Factor(R-Free) 0.3183
    Percent Reflections(Observed) 95.4
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.65
    Shell Resolution(Low) 3.94
    Number of Reflections(R-Free) 262
    Number of Reflections(R-Work) 5343
    R-Factor(R-Work) 0.2415
    R-Factor(R-Free) 0.2886
    Percent Reflections(Observed) 96.7
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.94
    Shell Resolution(Low) 4.33
    Number of Reflections(R-Free) 284
    Number of Reflections(R-Work) 5378
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2538
    Percent Reflections(Observed) 97.6
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.33
    Shell Resolution(Low) 4.96
    Number of Reflections(R-Free) 303
    Number of Reflections(R-Work) 5452
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.2287
    Percent Reflections(Observed) 98.4
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.96
    Shell Resolution(Low) 6.24
    Number of Reflections(R-Free) 293
    Number of Reflections(R-Work) 5503
    R-Factor(R-Work) 0.2067
    R-Factor(R-Free) 0.2696
    Percent Reflections(Observed) 98.3
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.24
    Shell Resolution(Low) 50.0
    Number of Reflections(R-Free) 297
    Number of Reflections(R-Work) 5740
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 98.6
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.537
    c_mcangle_it 2.052
    c_scbond_it 1.548
    c_mcbond_it 1.155
    c_angle_d 0.966
    c_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 16623
    Nucleic Acid Atoms 0
    Heterogen Atoms 76
    Solvent Atoms 149
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution Phaser
    Structure Refinement CNS
     
    Software
    data extraction pdb_extract version: 3.11
    refinement CNS
    data reduction HKL