X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.8
Temperature 291.0
Details 0.1M Bis Tris Propane, 0.2M Ammonium Sulfate, 22% Peg8000, pH 6.8, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 81.6 α = 90
b = 111.2 β = 90
c = 181.3 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 108
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR ADSC QUANTUM 315r -- 2011-04-27
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.07 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 40 99.8 0.085 -- -- 8.2 84591 84422 -- -1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.28 99.8 0.458 -- 4.0 7.5 8365

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.2 40.0 -- 0.0 84419 84266 4253 99.8 0.2135 0.2135 0.2135 0.2536 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2 2.28 -- 409 7932 0.3572 0.3778 -- 99.8
X Ray Diffraction 2.28 2.37 -- 396 7925 0.3221 0.3571 -- 100.0
X Ray Diffraction 2.37 2.48 -- 412 7951 0.2766 0.3161 -- 99.9
X Ray Diffraction 2.48 2.61 -- 420 7907 0.2483 0.2979 -- 99.9
X Ray Diffraction 2.61 2.77 -- 468 7933 0.2362 0.286 -- 99.9
X Ray Diffraction 2.77 2.99 -- 407 7966 0.2348 0.2905 -- 100.0
X Ray Diffraction 2.99 3.29 -- 413 8013 0.2241 0.2644 -- 100.0
X Ray Diffraction 3.29 3.76 -- 458 7999 0.2013 0.2414 -- 100.0
X Ray Diffraction 3.76 4.74 -- 427 8100 0.1713 0.2094 -- 99.9
X Ray Diffraction 4.74 40.0 -- 443 8287 0.1842 0.2236 -- 98.9
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 54.5483
Anisotropic B[1][1] 20.884
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -7.163
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -13.721
RMS Deviations
Key Refinement Restraint Deviation
c_scangle_it 3.041
c_mcangle_it 2.174
c_scbond_it 2.11
c_mcbond_it 1.331
c_angle_d 1.176
c_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9491
Nucleic Acid Atoms 0
Heterogen Atoms 88
Solvent Atoms 568

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL Data Reduction (intensity integration)
HKL Data Reduction (data scaling)
Phaser Structure Solution
CNS Structure Refinement
Software
Software Name Purpose
pdb_extract version: 3.11 data extraction
CNS refinement
HKL data reduction