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X-RAY DIFFRACTION
Materials and Methods page
4II2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.8
    Temperature 291.0
    Details 0.1M Bis Tris Propane, 0.2M Ammonium Sulfate, 22% Peg8000, pH 6.8, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 81.6 α = 90
    b = 111.2 β = 90
    c = 181.3 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 108
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315r
    Collection Date 2011-04-27
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.07
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -1.0
    Resolution(High) 2.2
    Resolution(Low) 40
    Number Reflections(All) 84591
    Number Reflections(Observed) 84422
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.085
    Redundancy 8.2
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.28
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.458
    Mean I Over Sigma(Observed) 4.0
    Redundancy 7.5
    Number Unique Reflections(All) 8365
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 40.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 84419
    Number of Reflections(Observed) 84266
    Number of Reflections(R-Free) 4253
    Percent Reflections(Observed) 99.8
    R-Factor(All) 0.2135
    R-Factor(Observed) 0.2135
    R-Work 0.2135
    R-Free 0.2536
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 54.5483
    Anisotropic B[1][1] 20.884
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -7.163
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -13.721
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.28
    Number of Reflections(R-Free) 409
    Number of Reflections(R-Work) 7932
    R-Factor(R-Work) 0.3572
    R-Factor(R-Free) 0.3778
    Percent Reflections(Observed) 99.8
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.28
    Shell Resolution(Low) 2.37
    Number of Reflections(R-Free) 396
    Number of Reflections(R-Work) 7925
    R-Factor(R-Work) 0.3221
    R-Factor(R-Free) 0.3571
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.37
    Shell Resolution(Low) 2.48
    Number of Reflections(R-Free) 412
    Number of Reflections(R-Work) 7951
    R-Factor(R-Work) 0.2766
    R-Factor(R-Free) 0.3161
    Percent Reflections(Observed) 99.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.48
    Shell Resolution(Low) 2.61
    Number of Reflections(R-Free) 420
    Number of Reflections(R-Work) 7907
    R-Factor(R-Work) 0.2483
    R-Factor(R-Free) 0.2979
    Percent Reflections(Observed) 99.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.61
    Shell Resolution(Low) 2.77
    Number of Reflections(R-Free) 468
    Number of Reflections(R-Work) 7933
    R-Factor(R-Work) 0.2362
    R-Factor(R-Free) 0.286
    Percent Reflections(Observed) 99.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.77
    Shell Resolution(Low) 2.99
    Number of Reflections(R-Free) 407
    Number of Reflections(R-Work) 7966
    R-Factor(R-Work) 0.2348
    R-Factor(R-Free) 0.2905
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.99
    Shell Resolution(Low) 3.29
    Number of Reflections(R-Free) 413
    Number of Reflections(R-Work) 8013
    R-Factor(R-Work) 0.2241
    R-Factor(R-Free) 0.2644
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.29
    Shell Resolution(Low) 3.76
    Number of Reflections(R-Free) 458
    Number of Reflections(R-Work) 7999
    R-Factor(R-Work) 0.2013
    R-Factor(R-Free) 0.2414
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.76
    Shell Resolution(Low) 4.74
    Number of Reflections(R-Free) 427
    Number of Reflections(R-Work) 8100
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.2094
    Percent Reflections(Observed) 99.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.74
    Shell Resolution(Low) 40.0
    Number of Reflections(R-Free) 443
    Number of Reflections(R-Work) 8287
    R-Factor(R-Work) 0.1842
    R-Factor(R-Free) 0.2236
    Percent Reflections(Observed) 98.9
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 3.041
    c_mcangle_it 2.174
    c_scbond_it 2.11
    c_mcbond_it 1.331
    c_angle_d 1.176
    c_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9491
    Nucleic Acid Atoms 0
    Heterogen Atoms 88
    Solvent Atoms 568
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution Phaser
    Structure Refinement CNS
     
    Software
    data extraction pdb_extract version: 3.11
    refinement CNS
    data reduction HKL