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X-RAY DIFFRACTION
Materials and Methods page
4IHJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.7
    Temperature 293.0
    Details 4-10% PEG 4000, 4-6% glycerol, 30 mM magnesium chloride, 30 mM calcium chloride, 100 mM MES/Imidazole, pH 6.7, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 104.52 α = 90
    b = 157.31 β = 90
    c = 180.99 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Collection Date 2011-12-15
     
    Diffraction Radiation
    Monochromator LN2 cooled fixed-exit Si(111) monochromator, Sagittally - horizontally focussed
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength List 0.999950
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2
    Resolution(Low) 72.14
    Number Reflections(All) 200646
    Number Reflections(Observed) 198918
    Percent Possible(Observed) 99.1
    B(Isotropic) From Wilson Plot 36.2
    Redundancy 26.8
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.05
    Percent Possible(All) 92.5
    Mean I Over Sigma(Observed) 1.17
    Redundancy 25.2
    Number Unique Reflections(All) 13684
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method Difference Fourier
    reflnsShellList 2.0
    Resolution(Low) 72.1
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 198918
    Number of Reflections(Observed) 198893
    Number of Reflections(R-Free) 10028
    Percent Reflections(Observed) 99.13
    R-Factor(Observed) 0.1702
    R-Work 0.1677
    R-Free 0.2174
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.2872
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 4.9205
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.3361
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.024
    Number of Reflections(R-Free) 294
    Number of Reflections(R-Work) 5333
    R-Factor(R-Work) 0.3115
    R-Factor(R-Free) 0.3247
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.024
    Shell Resolution(Low) 2.0478
    Number of Reflections(R-Free) 353
    Number of Reflections(R-Work) 6215
    R-Factor(R-Work) 0.2877
    R-Factor(R-Free) 0.3241
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0478
    Shell Resolution(Low) 2.0728
    Number of Reflections(R-Free) 325
    Number of Reflections(R-Work) 6268
    R-Factor(R-Work) 0.2703
    R-Factor(R-Free) 0.3119
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0728
    Shell Resolution(Low) 2.099
    Number of Reflections(R-Free) 352
    Number of Reflections(R-Work) 6219
    R-Factor(R-Work) 0.2734
    R-Factor(R-Free) 0.3201
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.099
    Shell Resolution(Low) 2.1266
    Number of Reflections(R-Free) 348
    Number of Reflections(R-Work) 6251
    R-Factor(R-Work) 0.2625
    R-Factor(R-Free) 0.3175
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1266
    Shell Resolution(Low) 2.1558
    Number of Reflections(R-Free) 311
    Number of Reflections(R-Work) 6225
    R-Factor(R-Work) 0.245
    R-Factor(R-Free) 0.3005
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1558
    Shell Resolution(Low) 2.1866
    Number of Reflections(R-Free) 317
    Number of Reflections(R-Work) 6245
    R-Factor(R-Work) 0.2303
    R-Factor(R-Free) 0.2908
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1866
    Shell Resolution(Low) 2.2192
    Number of Reflections(R-Free) 339
    Number of Reflections(R-Work) 6284
    R-Factor(R-Work) 0.2197
    R-Factor(R-Free) 0.2612
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2192
    Shell Resolution(Low) 2.2539
    Number of Reflections(R-Free) 317
    Number of Reflections(R-Work) 6284
    R-Factor(R-Work) 0.2251
    R-Factor(R-Free) 0.291
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2539
    Shell Resolution(Low) 2.2908
    Number of Reflections(R-Free) 336
    Number of Reflections(R-Work) 6247
    R-Factor(R-Work) 0.2152
    R-Factor(R-Free) 0.2866
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2908
    Shell Resolution(Low) 2.3303
    Number of Reflections(R-Free) 349
    Number of Reflections(R-Work) 6223
    R-Factor(R-Work) 0.2077
    R-Factor(R-Free) 0.2826
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3303
    Shell Resolution(Low) 2.3727
    Number of Reflections(R-Free) 337
    Number of Reflections(R-Work) 6315
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3727
    Shell Resolution(Low) 2.4183
    Number of Reflections(R-Free) 345
    Number of Reflections(R-Work) 6266
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4183
    Shell Resolution(Low) 2.4677
    Number of Reflections(R-Free) 341
    Number of Reflections(R-Work) 6286
    R-Factor(R-Work) 0.179
    R-Factor(R-Free) 0.2452
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4677
    Shell Resolution(Low) 2.5214
    Number of Reflections(R-Free) 322
    Number of Reflections(R-Work) 6302
    R-Factor(R-Work) 0.1811
    R-Factor(R-Free) 0.2538
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5214
    Shell Resolution(Low) 2.58
    Number of Reflections(R-Free) 338
    Number of Reflections(R-Work) 6290
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.2483
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.58
    Shell Resolution(Low) 2.6445
    Number of Reflections(R-Free) 329
    Number of Reflections(R-Work) 6284
    R-Factor(R-Work) 0.1604
    R-Factor(R-Free) 0.2211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6445
    Shell Resolution(Low) 2.7161
    Number of Reflections(R-Free) 319
    Number of Reflections(R-Work) 6346
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.2299
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7161
    Shell Resolution(Low) 2.796
    Number of Reflections(R-Free) 376
    Number of Reflections(R-Work) 6272
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.796
    Shell Resolution(Low) 2.8862
    Number of Reflections(R-Free) 319
    Number of Reflections(R-Work) 6366
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.2206
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8862
    Shell Resolution(Low) 2.9894
    Number of Reflections(R-Free) 293
    Number of Reflections(R-Work) 6354
    R-Factor(R-Work) 0.1633
    R-Factor(R-Free) 0.2319
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9894
    Shell Resolution(Low) 3.1091
    Number of Reflections(R-Free) 340
    Number of Reflections(R-Work) 6362
    R-Factor(R-Work) 0.1573
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1091
    Shell Resolution(Low) 3.2506
    Number of Reflections(R-Free) 309
    Number of Reflections(R-Work) 6378
    R-Factor(R-Work) 0.1676
    R-Factor(R-Free) 0.2166
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2506
    Shell Resolution(Low) 3.422
    Number of Reflections(R-Free) 358
    Number of Reflections(R-Work) 6355
    R-Factor(R-Work) 0.17
    R-Factor(R-Free) 0.2309
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.422
    Shell Resolution(Low) 3.6363
    Number of Reflections(R-Free) 347
    Number of Reflections(R-Work) 6380
    R-Factor(R-Work) 0.1607
    R-Factor(R-Free) 0.2219
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6363
    Shell Resolution(Low) 3.9171
    Number of Reflections(R-Free) 340
    Number of Reflections(R-Work) 6376
    R-Factor(R-Work) 0.1405
    R-Factor(R-Free) 0.1744
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9171
    Shell Resolution(Low) 4.3112
    Number of Reflections(R-Free) 322
    Number of Reflections(R-Work) 6452
    R-Factor(R-Work) 0.1262
    R-Factor(R-Free) 0.1712
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3112
    Shell Resolution(Low) 4.935
    Number of Reflections(R-Free) 351
    Number of Reflections(R-Work) 6449
    R-Factor(R-Work) 0.1042
    R-Factor(R-Free) 0.1418
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.935
    Shell Resolution(Low) 6.217
    Number of Reflections(R-Free) 346
    Number of Reflections(R-Work) 6510
    R-Factor(R-Work) 0.1427
    R-Factor(R-Free) 0.1751
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.217
    Shell Resolution(Low) 72.1843
    Number of Reflections(R-Free) 355
    Number of Reflections(R-Work) 6728
    R-Factor(R-Work) 0.1903
    R-Factor(R-Free) 0.2211
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.063
    f_dihedral_angle_d 15.717
    f_angle_d 1.14
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 17356
    Nucleic Acid Atoms 0
    Heterogen Atoms 189
    Solvent Atoms 1033
     
     
  •   Software and Computing Hide
    Computing
    Data Collection REMDAQ
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHENIX (phenix.refine: 1.7.3_928)
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHENIX version: (phenix.refine: 1.7.3_928)
    data collection REMDAQ