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X-RAY DIFFRACTION
Materials and Methods page
4IGJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.6
    Temperature 293.0
    Details 0.2 M ammonium sulfate, 0.1 M sodium citrate:HCl, pH 5.6, 15% PEG4000, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.71 α = 90
    b = 80.82 β = 90
    c = 88.05 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-10-03
     
    Diffraction Radiation
    Monochromator double crystal Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.48
    Resolution(Low) 59.54
    Number Reflections(All) 76480
    Number Reflections(Observed) 67101
    Percent Possible(Observed) 87.7
    R Merge I(Observed) 0.076
    Redundancy 7.8
     
    High Resolution Shell Details
    Resolution(High) 1.48
    Resolution(Low) 1.51
    Percent Possible(All) 94.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.48
    Resolution(Low) 36.219
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 67030
    Number of Reflections(R-Free) 3339
    Percent Reflections(Observed) 87.73
    R-Factor(Observed) 0.187
    R-Work 0.1857
    R-Free 0.2113
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.48
    Shell Resolution(Low) 1.5009
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2784
    R-Factor(R-Work) 0.1996
    R-Factor(R-Free) 0.2284
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5009
    Shell Resolution(Low) 1.5233
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2874
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2376
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5233
    Shell Resolution(Low) 1.5471
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2835
    R-Factor(R-Work) 0.1841
    R-Factor(R-Free) 0.2301
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5471
    Shell Resolution(Low) 1.5725
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2880
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.1899
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5725
    Shell Resolution(Low) 1.5996
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2840
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.2006
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5996
    Shell Resolution(Low) 1.6287
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2884
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6287
    Shell Resolution(Low) 1.66
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2867
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.184
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.66
    Shell Resolution(Low) 1.6939
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2889
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.208
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6939
    Shell Resolution(Low) 1.7307
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2884
    R-Factor(R-Work) 0.1749
    R-Factor(R-Free) 0.2129
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7307
    Shell Resolution(Low) 1.771
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2901
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.2211
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.771
    Shell Resolution(Low) 1.8153
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2898
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.1826
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8153
    Shell Resolution(Low) 1.8644
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2907
    R-Factor(R-Work) 0.1809
    R-Factor(R-Free) 0.2148
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8644
    Shell Resolution(Low) 1.9192
    Number of Reflections(R-Free) 64
    Number of Reflections(R-Work) 1273
    R-Factor(R-Work) 0.2015
    R-Factor(R-Free) 0.2464
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9192
    Shell Resolution(Low) 1.9812
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 1941
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.217
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9812
    Shell Resolution(Low) 2.052
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2955
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2311
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.052
    Shell Resolution(Low) 2.1341
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2942
    R-Factor(R-Work) 0.1809
    R-Factor(R-Free) 0.2183
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1341
    Shell Resolution(Low) 2.2312
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2393
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.188
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2312
    Shell Resolution(Low) 2.3488
    Number of Reflections(R-Free) 90
    Number of Reflections(R-Work) 1463
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.2337
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3488
    Shell Resolution(Low) 2.496
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2973
    R-Factor(R-Work) 0.1838
    R-Factor(R-Free) 0.2315
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.496
    Shell Resolution(Low) 2.6886
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3023
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.1909
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6886
    Shell Resolution(Low) 2.9591
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3039
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9591
    Shell Resolution(Low) 3.387
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3032
    R-Factor(R-Work) 0.1924
    R-Factor(R-Free) 0.2118
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.387
    Shell Resolution(Low) 4.2662
    Number of Reflections(R-Free) 58
    Number of Reflections(R-Work) 1080
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.1889
    Percent Reflections(Observed) 35.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2662
    Shell Resolution(Low) 36.2294
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3134
    R-Factor(R-Work) 0.193
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.071
    f_dihedral_angle_d 12.335
    f_angle_d 1.075
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3349
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 310
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building MOLREP
    data collection CBASS