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X-RAY DIFFRACTION
Materials and Methods page
4IGC
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 300.0
    Details 0.1M Hepes-HCl (pH7), 0.2M CaAcetate, 15% PEG400, VAPOR DIFFUSION, HANGING DROP, temperature 300K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 187.31 α = 90
    b = 205.9 β = 90
    c = 309.18 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 80
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2012-06-20
     
    Diffraction Radiation
    Monochromator Horizontal focusing 5.05 asymmetric cut Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength List 0.978
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.2
    Observed Criterion Sigma(I) 1.2
    Resolution(High) 3.6
    Resolution(Low) 30
    Number Reflections(Observed) 123447
    Percent Possible(Observed) 96.81
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.7
    Resolution(Low) 29.978
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 123400
    Number of Reflections(R-Free) 5897
    Percent Reflections(Observed) 96.77
    R-Factor(All) 0.2441
    R-Factor(Observed) 0.2441
    R-Work 0.2419
    R-Free 0.2854
    R-Free Selection Details 5%
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7
    Shell Resolution(Low) 3.742
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3529
    R-Factor(R-Work) 0.3613
    R-Factor(R-Free) 0.3765
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.742
    Shell Resolution(Low) 3.7859
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3827
    R-Factor(R-Work) 0.3558
    R-Factor(R-Free) 0.41
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7859
    Shell Resolution(Low) 3.832
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3879
    R-Factor(R-Work) 0.3576
    R-Factor(R-Free) 0.4035
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.832
    Shell Resolution(Low) 3.8804
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3796
    R-Factor(R-Work) 0.3557
    R-Factor(R-Free) 0.3855
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8804
    Shell Resolution(Low) 3.9313
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3669
    R-Factor(R-Work) 0.4064
    R-Factor(R-Free) 0.457
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9313
    Shell Resolution(Low) 3.9851
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3704
    R-Factor(R-Work) 0.3492
    R-Factor(R-Free) 0.3818
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9851
    Shell Resolution(Low) 4.0419
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3875
    R-Factor(R-Work) 0.2976
    R-Factor(R-Free) 0.4029
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0419
    Shell Resolution(Low) 4.1021
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3848
    R-Factor(R-Work) 0.2868
    R-Factor(R-Free) 0.3535
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1021
    Shell Resolution(Low) 4.166
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3877
    R-Factor(R-Work) 0.2629
    R-Factor(R-Free) 0.3286
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.166
    Shell Resolution(Low) 4.2341
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3871
    R-Factor(R-Work) 0.2621
    R-Factor(R-Free) 0.3069
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2341
    Shell Resolution(Low) 4.3069
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3881
    R-Factor(R-Work) 0.2565
    R-Factor(R-Free) 0.3317
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3069
    Shell Resolution(Low) 4.385
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3881
    R-Factor(R-Work) 0.2527
    R-Factor(R-Free) 0.3453
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.385
    Shell Resolution(Low) 4.4691
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3892
    R-Factor(R-Work) 0.2428
    R-Factor(R-Free) 0.2779
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4691
    Shell Resolution(Low) 4.56
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3863
    R-Factor(R-Work) 0.2378
    R-Factor(R-Free) 0.2971
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.56
    Shell Resolution(Low) 4.6588
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3870
    R-Factor(R-Work) 0.2362
    R-Factor(R-Free) 0.2983
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6588
    Shell Resolution(Low) 4.7667
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3898
    R-Factor(R-Work) 0.2272
    R-Factor(R-Free) 0.2642
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7667
    Shell Resolution(Low) 4.8855
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3927
    R-Factor(R-Work) 0.2275
    R-Factor(R-Free) 0.2893
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8855
    Shell Resolution(Low) 5.017
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3925
    R-Factor(R-Work) 0.2276
    R-Factor(R-Free) 0.2902
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.017
    Shell Resolution(Low) 5.1639
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3937
    R-Factor(R-Work) 0.2286
    R-Factor(R-Free) 0.2468
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1639
    Shell Resolution(Low) 5.3296
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3940
    R-Factor(R-Work) 0.227
    R-Factor(R-Free) 0.3065
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3296
    Shell Resolution(Low) 5.519
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 3968
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.3144
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.519
    Shell Resolution(Low) 5.7385
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3986
    R-Factor(R-Work) 0.2189
    R-Factor(R-Free) 0.2615
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7385
    Shell Resolution(Low) 5.9977
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3988
    R-Factor(R-Work) 0.2343
    R-Factor(R-Free) 0.2707
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9977
    Shell Resolution(Low) 6.3111
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 4015
    R-Factor(R-Work) 0.2477
    R-Factor(R-Free) 0.3417
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3111
    Shell Resolution(Low) 6.7024
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 4028
    R-Factor(R-Work) 0.2368
    R-Factor(R-Free) 0.2836
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7024
    Shell Resolution(Low) 7.2132
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4027
    R-Factor(R-Work) 0.2316
    R-Factor(R-Free) 0.2725
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.2132
    Shell Resolution(Low) 7.9269
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4038
    R-Factor(R-Work) 0.2092
    R-Factor(R-Free) 0.2331
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.9269
    Shell Resolution(Low) 9.0463
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 4048
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2195
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.0463
    Shell Resolution(Low) 11.2951
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 4052
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 11.2951
    Shell Resolution(Low) 29.9789
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4182
    R-Factor(R-Work) 0.2421
    R-Factor(R-Free) 0.2751
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.055
    f_dihedral_angle_d 13.086
    f_angle_d 0.778
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 56075
    Nucleic Acid Atoms 0
    Heterogen Atoms 6
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phenix
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building Phenix
    data collection HKL-2000