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X-RAY DIFFRACTION
Materials and Methods page
4IG0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.7
    Temperature 277.0
    Details 11% PEG 8000, 4% PEG 400, 50 MM IMIDAZOLE, 10 MM SPERMINE, 15 MM MGSO4, 100 MM AMMONIUM SULFATE,AND 5 MM TRIS(2-CARBOXYETHYL)PHOSPHINE, PH 6.7, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 162.34 α = 90
    b = 73.35 β = 99.67
    c = 108.79 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2009-11-15
     
    Diffraction Radiation
    Monochromator SI 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength 0.917
    Wavelength List 1.075
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -2.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(All) 44020
    Number Reflections(Observed) 43932
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.063
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.609
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 43.141
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 43820
    Number of Reflections(R-Free) 2206
    Percent Reflections(Observed) 99.69
    R-Factor(Observed) 0.2032
    R-Work 0.2009
    R-Free 0.2432
    R-Free Selection Details 2%
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4988
    Shell Resolution(Low) 2.5531
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.2629
    R-Factor(R-Free) 0.2809
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5531
    Shell Resolution(Low) 2.6125
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.2473
    R-Factor(R-Free) 0.2973
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6125
    Shell Resolution(Low) 2.6778
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2404
    R-Factor(R-Free) 0.3052
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6778
    Shell Resolution(Low) 2.7502
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.2507
    R-Factor(R-Free) 0.2849
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7502
    Shell Resolution(Low) 2.8311
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.2456
    R-Factor(R-Free) 0.317
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8311
    Shell Resolution(Low) 2.9225
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.2371
    R-Factor(R-Free) 0.3077
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9225
    Shell Resolution(Low) 3.0269
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.2436
    R-Factor(R-Free) 0.3072
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0269
    Shell Resolution(Low) 3.1481
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.2429
    R-Factor(R-Free) 0.2834
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1481
    Shell Resolution(Low) 3.2913
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.2364
    R-Factor(R-Free) 0.2912
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2913
    Shell Resolution(Low) 3.4647
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4647
    Shell Resolution(Low) 3.6817
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.2251
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6817
    Shell Resolution(Low) 3.9658
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.1752
    R-Factor(R-Free) 0.2347
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9658
    Shell Resolution(Low) 4.3645
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.1718
    R-Factor(R-Free) 0.2096
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3645
    Shell Resolution(Low) 4.9953
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.2039
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9953
    Shell Resolution(Low) 6.2904
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.1946
    R-Factor(R-Free) 0.232
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2904
    Shell Resolution(Low) 43.1477
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2338
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 14.277
    f_angle_d 1.027
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7955
    Nucleic Acid Atoms 0
    Heterogen Atoms 70
    Solvent Atoms 66
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: dev_1233)
    Structure Refinement PHENIX (phenix.refine: dev_1233)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1233)
    model building PHENIX version: (phenix.refine: dev_1233)
    data collection CBASS