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X-RAY DIFFRACTION
Materials and Methods page
4IFZ
  •   Crystallization Hide
    Crystallization Experiments
    Method hanging-drop vapor diffusion
    pH 6.5
    Temperature 293.0
    Details 0.1 M MES, 0.8 M sodium acetate, 0.1 M NaCl, 20% (w/v) ethylene glycol, pH 6.5, hanging-drop vapor diffusion, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 116.63 α = 90
    b = 46.91 β = 102.17
    c = 57.62 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details monochromator
    Collection Date 2012-03-14
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source synchrotron
    Type APS BEAMLINE 19-ID
    Wavelength List 1.49993
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(All) 24023
    Number Reflections(Observed) 24023
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.046
    Redundancy 6.0
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.93
    Percent Possible(All) 98.6
    R Merge I(Observed) 0.232
    Redundancy 5.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 1.9012
    Resolution(Low) 29.529
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 24011
    Number of Reflections(Observed) 24011
    Number of Reflections(R-Free) 1187
    Percent Reflections(Observed) 99.31
    R-Factor(Observed) 0.1608
    R-Work 0.1585
    R-Free 0.2034
     
    Temperature Factor Modeling
    Mean Isotropic B Value 33.4143
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9012
    Shell Resolution(Low) 1.9877
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.1529
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9877
    Shell Resolution(Low) 2.0925
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2813
    R-Factor(R-Work) 0.1481
    R-Factor(R-Free) 0.2174
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0925
    Shell Resolution(Low) 2.2235
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2834
    R-Factor(R-Work) 0.1487
    R-Factor(R-Free) 0.2073
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2235
    Shell Resolution(Low) 2.3951
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2853
    R-Factor(R-Work) 0.1478
    R-Factor(R-Free) 0.2129
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3951
    Shell Resolution(Low) 2.636
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2839
    R-Factor(R-Work) 0.1587
    R-Factor(R-Free) 0.2048
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.636
    Shell Resolution(Low) 3.0171
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2867
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0171
    Shell Resolution(Low) 3.8
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2893
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.1967
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8
    Shell Resolution(Low) 29.5324
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2963
    R-Factor(R-Work) 0.1589
    R-Factor(R-Free) 0.1945
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.082
    f_dihedral_angle_d 12.386
    f_angle_d 1.268
    f_bond_d 0.015
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2521
    Nucleic Acid Atoms 0
    Heterogen Atoms 25
    Solvent Atoms 159
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL-3000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction SCALEPACK