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X-RAY DIFFRACTION
Materials and Methods page
4IFY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.7
    Temperature 277.0
    Details 11% PEG 8000, 4% PEG 400, 50 MM IMIDAZOLE, 10 MM SPERMINE, 15 MM MGSO4, 100 MM AMMONIUM SULFATE, AND 5 MM TRIS(2-CARBOXYETHYL)PHOSPHINE, PH 6.7, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 161.95 α = 90
    b = 73.05 β = 100.47
    c = 108.75 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2008-12-20
     
    Diffraction Radiation
    Monochromator SI 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength 0.917
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -2.0
    Resolution(High) 2.1
    Resolution(Low) 50
    Number Reflections(All) 73811
    Number Reflections(Observed) 73738
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.077
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.14
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.629
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 31.312
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 72971
    Number of Reflections(R-Free) 1447
    Percent Reflections(Observed) 99.88
    R-Factor(Observed) 0.1869
    R-Work 0.1864
    R-Free 0.2126
    R-Free Selection Details 2%
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.175
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 7076
    R-Factor(R-Work) 0.2389
    R-Factor(R-Free) 0.2853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.175
    Shell Resolution(Low) 2.2621
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 7090
    R-Factor(R-Work) 0.233
    R-Factor(R-Free) 0.2722
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2621
    Shell Resolution(Low) 2.365
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 7121
    R-Factor(R-Work) 0.2175
    R-Factor(R-Free) 0.2682
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.365
    Shell Resolution(Low) 2.4897
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 7074
    R-Factor(R-Work) 0.2135
    R-Factor(R-Free) 0.2438
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4897
    Shell Resolution(Low) 2.6456
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 7170
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2562
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6456
    Shell Resolution(Low) 2.8497
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 7163
    R-Factor(R-Work) 0.1975
    R-Factor(R-Free) 0.2382
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8497
    Shell Resolution(Low) 3.1363
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 7126
    R-Factor(R-Work) 0.1944
    R-Factor(R-Free) 0.2393
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1363
    Shell Resolution(Low) 3.5895
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 7185
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2107
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5895
    Shell Resolution(Low) 4.5202
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 7209
    R-Factor(R-Work) 0.1589
    R-Factor(R-Free) 0.1949
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5202
    Shell Resolution(Low) 31.3152
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 7310
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.1629
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.089
    f_dihedral_angle_d 14.69
    f_angle_d 1.19
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7929
    Nucleic Acid Atoms 0
    Heterogen Atoms 106
    Solvent Atoms 662
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADX
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: dev_1233)
    Structure Refinement PHENIX (phenix.refine: dev_1233)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1233)
    model building PHENIX version: (phenix.refine: dev_1233)
    data collection ADX