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X-RAY DIFFRACTION
Materials and Methods page
4IFU
  •   Crystallization Hide
    Crystallization Experiments
    Method hanging-drop vapor diffusion
    pH 6.5
    Temperature 293.0
    Details 0.1 M sodium cacodylate, 0.8 M sodium acetate, 0.1 M NaCl, 20% (w/v) ethylene glycol;, pH 6.5, hanging-drop vapor diffusion, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.59 α = 90
    b = 47.28 β = 102.04
    c = 57.59 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details monochromator
    Collection Date 2011-08-12
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source synchrotron
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97929
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.83
    Resolution(Low) 50
    Number Reflections(All) 27231
    Number Reflections(Observed) 27231
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.076
    Redundancy 4.0
     
    High Resolution Shell Details
    Resolution(High) 1.83
    Resolution(Low) 1.86
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.574
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8334
    Resolution(Low) 28.75
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 27219
    Number of Reflections(Observed) 27219
    Number of Reflections(R-Free) 1364
    Percent Reflections(Observed) 99.41
    R-Factor(Observed) 0.1717
    R-Work 0.1693
    R-Free 0.2171
     
    Temperature Factor Modeling
    Mean Isotropic B Value 31.6911
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8334
    Shell Resolution(Low) 1.8989
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2446
    R-Factor(R-Work) 0.2159
    R-Factor(R-Free) 0.2635
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8989
    Shell Resolution(Low) 1.9749
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2469
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9749
    Shell Resolution(Low) 2.0648
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.2358
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0648
    Shell Resolution(Low) 2.1736
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.2296
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1736
    Shell Resolution(Low) 2.3097
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.1652
    R-Factor(R-Free) 0.2208
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3097
    Shell Resolution(Low) 2.488
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.1626
    R-Factor(R-Free) 0.2125
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.488
    Shell Resolution(Low) 2.7382
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2583
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.2284
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7382
    Shell Resolution(Low) 3.134
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2482
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.134
    Shell Resolution(Low) 3.9469
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9469
    Shell Resolution(Low) 28.7537
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1553
    R-Factor(R-Free) 0.1803
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.081
    f_dihedral_angle_d 12.354
    f_angle_d 1.277
    f_bond_d 0.018
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2521
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 169
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser
    data reduction SCALEPACK