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X-RAY DIFFRACTION
Materials and Methods page
4IEM
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 6
    Temperature 298.0
    Details 50 mM MES pH 6.0, 200 mM LiSO4, and 25% mPEG 2K, vapor diffusion, hanging drop, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 104.64 α = 90
    b = 74.09 β = 111.98
    c = 112.14 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Collection Date 2001-07
     
    Diffraction Radiation
    Diffraction Protocol single wavelength
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 5.0.1
    Wavelength List 0.97956
    Site ALS
    Beamline 5.0.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.39
    Resolution(Low) 30
    Number Reflections(Observed) 56727
    Percent Possible(Observed) 90.05
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3936
    Resolution(Low) 29.643
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 56705
    Number of Reflections(R-Free) 2868
    Percent Reflections(Observed) 90.01
    R-Factor(Observed) 0.2099
    R-Work 0.2079
    R-Free 0.2462
     
    Temperature Factor Modeling
    Mean Isotropic B Value 54.8586
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3936
    Shell Resolution(Low) 2.4348
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.2854
    R-Factor(R-Free) 0.3756
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4348
    Shell Resolution(Low) 2.4791
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.2724
    R-Factor(R-Free) 0.3432
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4791
    Shell Resolution(Low) 2.5267
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2772
    R-Factor(R-Free) 0.3347
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5267
    Shell Resolution(Low) 2.5783
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.2698
    R-Factor(R-Free) 0.3405
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5783
    Shell Resolution(Low) 2.6343
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.259
    R-Factor(R-Free) 0.3228
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6343
    Shell Resolution(Low) 2.6955
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.2532
    R-Factor(R-Free) 0.2942
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6955
    Shell Resolution(Low) 2.7629
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.2617
    R-Factor(R-Free) 0.3414
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7629
    Shell Resolution(Low) 2.8376
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.254
    R-Factor(R-Free) 0.2781
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8376
    Shell Resolution(Low) 2.921
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.2556
    R-Factor(R-Free) 0.3164
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.921
    Shell Resolution(Low) 3.0152
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.2527
    R-Factor(R-Free) 0.3418
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0152
    Shell Resolution(Low) 3.1228
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.2463
    R-Factor(R-Free) 0.2939
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1228
    Shell Resolution(Low) 3.2477
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.2339
    R-Factor(R-Free) 0.2514
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2477
    Shell Resolution(Low) 3.3953
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.2206
    R-Factor(R-Free) 0.2781
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3953
    Shell Resolution(Low) 3.5741
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.2463
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5741
    Shell Resolution(Low) 3.7976
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2365
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7976
    Shell Resolution(Low) 4.0901
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.1886
    R-Factor(R-Free) 0.2291
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0901
    Shell Resolution(Low) 4.5004
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2852
    R-Factor(R-Work) 0.1756
    R-Factor(R-Free) 0.1971
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5004
    Shell Resolution(Low) 5.1487
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2974
    R-Factor(R-Work) 0.1759
    R-Factor(R-Free) 0.2031
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1487
    Shell Resolution(Low) 6.4756
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3001
    R-Factor(R-Work) 0.1835
    R-Factor(R-Free) 0.2161
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4756
    Shell Resolution(Low) 29.6451
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3064
    R-Factor(R-Work) 0.1678
    R-Factor(R-Free) 0.1741
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.047
    f_dihedral_angle_d 19.512
    f_angle_d 0.918
    f_bond_d 0.017
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8809
    Nucleic Acid Atoms 1697
    Heterogen Atoms 16
    Solvent Atoms 272
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) SCALEPACK
    Structure Solution AMORE
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement AMORE
    data reduction SCALEPACK