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X-RAY DIFFRACTION
Materials and Methods page
4IDU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 297.0
    Details 0.2M sodium formate, 20% PEG3350, pH 7, VAPOR DIFFUSION, SITTING DROP, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 76.32 α = 90
    b = 86.44 β = 101.26
    c = 77.4 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 0
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 4r
    Collection Date 2012-07-13
     
    Diffraction Radiation
    Monochromator Graphite
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength List 0.9218
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.4
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3.06
    Resolution(Low) 33.92
    Number Reflections(All) 18405
    Number Reflections(Observed) 18304
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.093
    B(Isotropic) From Wilson Plot 35.0
    Redundancy 7.5
     
    High Resolution Shell Details
    Resolution(High) 3.06
    Resolution(Low) 3.16
    Percent Possible(All) 93.8
    R Merge I(Observed) 0.773
    Mean I Over Sigma(Observed) 2.6
    R-Sym I(Observed) 0.76
    Redundancy 6.9
    Number Unique Reflections(All) 1260
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 3.08
    Resolution(Low) 29.71
    Number of Reflections(all) 18405
    Number of Reflections(Observed) 17787
    Number of Reflections(R-Free) 960
    Percent Reflections(Observed) 99.85
    R-Factor(Observed) 0.32283
    R-Work 0.32051
    R-Free 0.36425
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 100.413
    Anisotropic B[1][1] -0.06
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.03
    Anisotropic B[2][2] -0.39
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.47
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.08
    Shell Resolution(Low) 3.139
    Number of Reflections(R-Free) 69
    Number of Reflections(R-Work) 1234
    R-Factor(R-Work) 0.323
    R-Factor(R-Free) 0.306
    Percent Reflections(Observed) 99.69
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_refined 0.005
    r_chiral_restr 0.11
    r_dihedral_angle_4_deg 18.623
    r_dihedral_angle_3_deg 21.188
    r_dihedral_angle_2_deg 37.494
    r_dihedral_angle_1_deg 6.856
    r_angle_refined_deg 1.531
    r_bond_refined_d 0.008
     
    Coordinate Error
    Luzzati ESD(Observed) 0.025
    Luzzati Sigma A(Observed) 0.25
    Luzzati Resolution Cutoff(Low) 4.0
    Luzzati ESD(R-Free Set) 0.32
    Luzzati Sigma A(R-Free Set) 0.36
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6838
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection EDNA
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution SHELXS
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building SHELXS
    data collection EDNA