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X-RAY DIFFRACTION
Materials and Methods page
4IDQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.4
    Temperature 293.0
    Details 0.2 M lithium citrate tribasic tetrahydrate, 20% PEG3350, pH 8.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 128.99 α = 90
    b = 267.08 β = 90
    c = 62.05 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2011-03-06
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength List 0.987
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 96866
    Number Reflections(Observed) 92313
    Percent Possible(Observed) 95.3
    Redundancy 14.6
     
    High Resolution Shell Details
    Resolution(High) 2.295
    Resolution(Low) 2.38
    Percent Possible(All) 81.1
    Mean I Over Sigma(Observed) 10.5
    R-Sym I(Observed) 0.504
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.295
    Resolution(Low) 41.139
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 96866
    Number of Reflections(Observed) 88117
    Number of Reflections(R-Free) 1919
    Percent Reflections(Observed) 90.89
    R-Factor(Observed) 0.2071
    R-Work 0.2061
    R-Free 0.256
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.295
    Shell Resolution(Low) 2.3521
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 4959
    R-Factor(R-Work) 0.2854
    R-Factor(R-Free) 0.3923
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3521
    Shell Resolution(Low) 2.4157
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6027
    R-Factor(R-Work) 0.2605
    R-Factor(R-Free) 0.3046
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4157
    Shell Resolution(Low) 2.4868
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6009
    R-Factor(R-Work) 0.2407
    R-Factor(R-Free) 0.292
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4868
    Shell Resolution(Low) 2.567
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 6037
    R-Factor(R-Work) 0.2228
    R-Factor(R-Free) 0.2695
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.567
    Shell Resolution(Low) 2.6587
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 6074
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.2777
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6587
    Shell Resolution(Low) 2.7652
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 6083
    R-Factor(R-Work) 0.2245
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7652
    Shell Resolution(Low) 2.891
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6169
    R-Factor(R-Work) 0.2312
    R-Factor(R-Free) 0.2936
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.891
    Shell Resolution(Low) 3.0434
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6313
    R-Factor(R-Work) 0.23
    R-Factor(R-Free) 0.2829
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0434
    Shell Resolution(Low) 3.234
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 6422
    R-Factor(R-Work) 0.2223
    R-Factor(R-Free) 0.2769
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.234
    Shell Resolution(Low) 3.4835
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 6516
    R-Factor(R-Work) 0.2075
    R-Factor(R-Free) 0.2548
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4835
    Shell Resolution(Low) 3.8339
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6352
    R-Factor(R-Work) 0.1876
    R-Factor(R-Free) 0.2458
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8339
    Shell Resolution(Low) 4.3881
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6226
    R-Factor(R-Work) 0.1702
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3881
    Shell Resolution(Low) 5.5264
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6365
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5264
    Shell Resolution(Low) 41.1459
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 6646
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2401
    Percent Reflections(Observed) 93.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.082
    f_dihedral_angle_d 16.304
    f_angle_d 1.187
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13440
    Nucleic Acid Atoms 0
    Heterogen Atoms 212
    Solvent Atoms 704
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phenix, phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building phaser
    model building phenix
    data collection HKL-2000