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X-RAY DIFFRACTION
Materials and Methods page
4IDP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.4
    Temperature 293.0
    Details 0.2 M lithium citrate tribasic tetrahydrate, 20% PEG3350, pH 8.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 131.95 α = 90
    b = 268.12 β = 90
    c = 62.43 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2011-05-04
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength List 0.987
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.59
    Resolution(Low) 50
    Number Reflections(All) 69849
    Number Reflections(Observed) 69639
    Percent Possible(Observed) 99.7
    Redundancy 7.8
     
    High Resolution Shell Details
    Resolution(High) 2.587
    Resolution(Low) 2.69
    Percent Possible(All) 97.4
    Mean I Over Sigma(Observed) 3.1
    R-Sym I(Observed) 0.611
    Redundancy 6.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.587
    Resolution(Low) 49.678
    Cut-off Sigma(F) 0.32
    Number of Reflections(all) 69849
    Number of Reflections(Observed) 56408
    Number of Reflections(R-Free) 1985
    Percent Reflections(Observed) 80.31
    R-Factor(Observed) 0.2025
    R-Work 0.2012
    R-Free 0.236
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.587
    Shell Resolution(Low) 2.6521
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 3209
    R-Factor(R-Work) 0.2816
    R-Factor(R-Free) 0.3531
    Percent Reflections(Observed) 68.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6521
    Shell Resolution(Low) 2.7238
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 3698
    R-Factor(R-Work) 0.2679
    R-Factor(R-Free) 0.3301
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7238
    Shell Resolution(Low) 2.8039
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 3741
    R-Factor(R-Work) 0.2641
    R-Factor(R-Free) 0.2971
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8039
    Shell Resolution(Low) 2.8944
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 3693
    R-Factor(R-Work) 0.2568
    R-Factor(R-Free) 0.2753
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8944
    Shell Resolution(Low) 2.9978
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 3721
    R-Factor(R-Work) 0.2577
    R-Factor(R-Free) 0.3501
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9978
    Shell Resolution(Low) 3.1178
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3833
    R-Factor(R-Work) 0.2442
    R-Factor(R-Free) 0.3024
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1178
    Shell Resolution(Low) 3.2597
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3925
    R-Factor(R-Work) 0.2265
    R-Factor(R-Free) 0.2558
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2597
    Shell Resolution(Low) 3.4315
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 4130
    R-Factor(R-Work) 0.2155
    R-Factor(R-Free) 0.2806
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4315
    Shell Resolution(Low) 3.6465
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 4064
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2248
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6465
    Shell Resolution(Low) 3.9279
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3998
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.222
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9279
    Shell Resolution(Low) 4.323
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3985
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.2099
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.323
    Shell Resolution(Low) 4.948
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 4024
    R-Factor(R-Work) 0.15
    R-Factor(R-Free) 0.1357
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.948
    Shell Resolution(Low) 6.2321
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 4131
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.2092
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2321
    Shell Resolution(Low) 49.6874
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 4271
    R-Factor(R-Work) 0.1737
    R-Factor(R-Free) 0.1866
    Percent Reflections(Observed) 83.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.01
    f_chiral_restr 0.098
    f_dihedral_angle_d 15.529
    f_angle_d 1.676
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13409
    Nucleic Acid Atoms 0
    Heterogen Atoms 132
    Solvent Atoms 403
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phenix, phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building phaser
    model building phenix
    data collection HKL-2000