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X-RAY DIFFRACTION
Materials and Methods page
4IDO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 293.0
    Details 0.2 M ammonium phosphate dibasic, 20% PEG3350, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.61 α = 90
    b = 116.43 β = 90
    c = 185.4 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2012-03-03
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength List 0.987
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.09
    Resolution(Low) 50
    Number Reflections(All) 64491
    Number Reflections(Observed) 63782
    Percent Possible(Observed) 98.9
    Redundancy 8.0
     
    High Resolution Shell Details
    Resolution(High) 2.091
    Resolution(Low) 2.18
    Percent Possible(All) 96.8
    Mean I Over Sigma(Observed) 4.1
    R-Sym I(Observed) 0.474
    Redundancy 6.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.091
    Resolution(Low) 43.74
    Cut-off Sigma(F) 1.3
    Number of Reflections(all) 64491
    Number of Reflections(Observed) 61511
    Number of Reflections(R-Free) 1927
    Percent Reflections(Observed) 95.25
    R-Factor(Observed) 0.2004
    R-Work 0.1988
    R-Free 0.2493
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.091
    Shell Resolution(Low) 2.1431
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 4079
    R-Factor(R-Work) 0.2382
    R-Factor(R-Free) 0.2912
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1431
    Shell Resolution(Low) 2.201
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 3986
    R-Factor(R-Work) 0.3314
    R-Factor(R-Free) 0.3657
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.201
    Shell Resolution(Low) 2.2658
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 3598
    R-Factor(R-Work) 0.4227
    R-Factor(R-Free) 0.5286
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2658
    Shell Resolution(Low) 2.3389
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 3300
    R-Factor(R-Work) 0.3898
    R-Factor(R-Free) 0.5284
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3389
    Shell Resolution(Low) 2.4225
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4333
    R-Factor(R-Work) 0.2103
    R-Factor(R-Free) 0.261
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4225
    Shell Resolution(Low) 2.5195
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4383
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2509
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5195
    Shell Resolution(Low) 2.6341
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4404
    R-Factor(R-Work) 0.1953
    R-Factor(R-Free) 0.2309
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6341
    Shell Resolution(Low) 2.773
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4420
    R-Factor(R-Work) 0.202
    R-Factor(R-Free) 0.2794
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.773
    Shell Resolution(Low) 2.9467
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4441
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.2581
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9467
    Shell Resolution(Low) 3.1741
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4425
    R-Factor(R-Work) 0.1934
    R-Factor(R-Free) 0.2457
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1741
    Shell Resolution(Low) 3.4934
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 4492
    R-Factor(R-Work) 0.1818
    R-Factor(R-Free) 0.2314
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4934
    Shell Resolution(Low) 3.9986
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 4412
    R-Factor(R-Work) 0.166
    R-Factor(R-Free) 0.1888
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9986
    Shell Resolution(Low) 5.0367
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 4569
    R-Factor(R-Work) 0.1317
    R-Factor(R-Free) 0.1782
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0367
    Shell Resolution(Low) 43.7497
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 4742
    R-Factor(R-Work) 0.1602
    R-Factor(R-Free) 0.191
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.081
    f_dihedral_angle_d 15.914
    f_angle_d 1.229
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6704
    Nucleic Acid Atoms 0
    Heterogen Atoms 68
    Solvent Atoms 661
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phenix, phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building phaser
    model building phenix
    data collection HKL-2000