POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4IDN
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.0
    Details 0.1 M imidazole, pH 7.0, 20% v/v Jeffamine ED-2001, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.69 α = 90
    b = 115.78 β = 90
    c = 181.13 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2012-03-03
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength List 0.987
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(All) 53078
    Number Reflections(Observed) 47929
    Percent Possible(Observed) 90.3
    Redundancy 7.0
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.28
    Percent Possible(All) 41.7
    Mean I Over Sigma(Observed) 1.9
    R-Sym I(Observed) 0.593
    Redundancy 4.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.252
    Resolution(Low) 47.918
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 53078
    Number of Reflections(Observed) 47830
    Number of Reflections(R-Free) 1998
    Percent Reflections(Observed) 94.78
    R-Factor(All) 0.1748
    R-Factor(Observed) 0.1748
    R-Work 0.1729
    R-Free 0.2176
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.252
    Shell Resolution(Low) 2.3086
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2831
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.3029
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3086
    Shell Resolution(Low) 2.371
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 3109
    R-Factor(R-Work) 0.2157
    R-Factor(R-Free) 0.2937
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.371
    Shell Resolution(Low) 2.4408
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 3082
    R-Factor(R-Work) 0.21
    R-Factor(R-Free) 0.2693
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4408
    Shell Resolution(Low) 2.5195
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3138
    R-Factor(R-Work) 0.2022
    R-Factor(R-Free) 0.2536
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5195
    Shell Resolution(Low) 2.6096
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3158
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2598
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6096
    Shell Resolution(Low) 2.7141
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3146
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7141
    Shell Resolution(Low) 2.8376
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3212
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.2552
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8376
    Shell Resolution(Low) 2.9871
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3295
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2587
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9871
    Shell Resolution(Low) 3.1743
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3351
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.2639
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1743
    Shell Resolution(Low) 3.4193
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3398
    R-Factor(R-Work) 0.1739
    R-Factor(R-Free) 0.2442
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4193
    Shell Resolution(Low) 3.7633
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3454
    R-Factor(R-Work) 0.1626
    R-Factor(R-Free) 0.1897
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7633
    Shell Resolution(Low) 4.3075
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 3466
    R-Factor(R-Work) 0.1369
    R-Factor(R-Free) 0.1847
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3075
    Shell Resolution(Low) 5.4258
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3519
    R-Factor(R-Work) 0.1385
    R-Factor(R-Free) 0.1755
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4258
    Shell Resolution(Low) 47.9285
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3673
    R-Factor(R-Work) 0.1634
    R-Factor(R-Free) 0.179
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.067
    f_dihedral_angle_d 15.783
    f_angle_d 0.979
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6752
    Nucleic Acid Atoms 0
    Heterogen Atoms 66
    Solvent Atoms 364
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phenix, phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building phaser
    model building Phenix
    data collection HKL-2000