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X-RAY DIFFRACTION
Materials and Methods page
4IDK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.7
    Temperature 277.0
    Details 11% PEG 8000, 4% PEG 400, 50 MM IMIDAZOLE, 10 MM SPERMINE, 15 MM MGSO4, 100 MM AMMONIUM SULFATE,AND 5 MM TRIS(2-CARBOXYETHYL)PHOSPHINE, PH 6.7, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 161.88 α = 90
    b = 73.07 β = 100.48
    c = 108.96 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2009-10-10
     
    Diffraction Radiation
    Monochromator SI 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength 0.917
    Wavelength List 1.00
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Resolution(High) 2.1
    Resolution(Low) 50
    Number Reflections(All) 73564
    Number Reflections(Observed) 73263
    Percent Possible(Observed) 99.59
    R Merge I(Observed) 0.07
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.14
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.723
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 42.934
    Cut-off Sigma(F) 1.33
    Number of Reflections(Observed) 73105
    Number of Reflections(R-Free) 3447
    Percent Reflections(Observed) 99.59
    R-Factor(Observed) 0.1839
    R-Work 0.1817
    R-Free 0.2246
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0981
    Shell Resolution(Low) 2.1257
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2503
    R-Factor(R-Work) 0.2441
    R-Factor(R-Free) 0.2937
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1257
    Shell Resolution(Low) 2.1548
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.2317
    R-Factor(R-Free) 0.2705
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1548
    Shell Resolution(Low) 2.1856
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.2252
    R-Factor(R-Free) 0.2637
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1856
    Shell Resolution(Low) 2.2182
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.2227
    R-Factor(R-Free) 0.2959
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2182
    Shell Resolution(Low) 2.2529
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.2159
    R-Factor(R-Free) 0.2498
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2529
    Shell Resolution(Low) 2.2898
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.2564
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2898
    Shell Resolution(Low) 2.3293
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2034
    R-Factor(R-Free) 0.2462
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3293
    Shell Resolution(Low) 2.3717
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2468
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3717
    Shell Resolution(Low) 2.4173
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.2883
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4173
    Shell Resolution(Low) 2.4666
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.1916
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4666
    Shell Resolution(Low) 2.5202
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2678
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5202
    Shell Resolution(Low) 2.5789
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.1876
    R-Factor(R-Free) 0.2278
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5789
    Shell Resolution(Low) 2.6433
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.1872
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6433
    Shell Resolution(Low) 2.7148
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1874
    R-Factor(R-Free) 0.2576
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7148
    Shell Resolution(Low) 2.7947
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1902
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7947
    Shell Resolution(Low) 2.8849
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2606
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8849
    Shell Resolution(Low) 2.9879
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1928
    R-Factor(R-Free) 0.2544
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9879
    Shell Resolution(Low) 3.1075
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.1926
    R-Factor(R-Free) 0.2216
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1075
    Shell Resolution(Low) 3.2489
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2637
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2489
    Shell Resolution(Low) 3.4202
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1823
    R-Factor(R-Free) 0.254
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4202
    Shell Resolution(Low) 3.6343
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1739
    R-Factor(R-Free) 0.2135
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6343
    Shell Resolution(Low) 3.9148
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1599
    R-Factor(R-Free) 0.1965
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9148
    Shell Resolution(Low) 4.3084
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.1821
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3084
    Shell Resolution(Low) 4.9311
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.1552
    R-Factor(R-Free) 0.1944
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9311
    Shell Resolution(Low) 6.2096
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2096
    Shell Resolution(Low) 42.943
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2763
    R-Factor(R-Work) 0.1795
    R-Factor(R-Free) 0.2002
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.086
    f_dihedral_angle_d 14.728
    f_angle_d 1.13
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7929
    Nucleic Acid Atoms 0
    Heterogen Atoms 108
    Solvent Atoms 650
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.8.1_1168)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHENIX version: (phenix.refine: 1.8.1_1168)
    data collection CBASS