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X-RAY DIFFRACTION
Materials and Methods page
4ID5
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.7
    Details pH 6.7
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 162.05 α = 90
    b = 72.87 β = 100.47
    c = 109.15 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2009-11-07
     
    Diffraction Radiation
    Monochromator SI 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength 0.917
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -2.0
    Resolution(High) 1.95
    Resolution(Low) 50
    Number Reflections(All) 91491
    Number Reflections(Observed) 91214
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.064
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 1.98
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.553
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 29.201
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 90998
    Number of Reflections(R-Free) 1841
    Percent Reflections(Observed) 99.69
    R-Factor(Observed) 0.1879
    R-Work 0.1874
    R-Free 0.2089
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 2.0027
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 6833
    R-Factor(R-Work) 0.2324
    R-Factor(R-Free) 0.2502
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0027
    Shell Resolution(Low) 2.0616
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 6860
    R-Factor(R-Work) 0.2247
    R-Factor(R-Free) 0.3252
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0616
    Shell Resolution(Low) 2.1282
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6817
    R-Factor(R-Work) 0.2181
    R-Factor(R-Free) 0.2575
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1282
    Shell Resolution(Low) 2.2042
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6852
    R-Factor(R-Work) 0.2105
    R-Factor(R-Free) 0.2561
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2042
    Shell Resolution(Low) 2.2924
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 6845
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.2494
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2924
    Shell Resolution(Low) 2.3967
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 6853
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.2507
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3967
    Shell Resolution(Low) 2.523
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 6853
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.2188
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.523
    Shell Resolution(Low) 2.681
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 6844
    R-Factor(R-Work) 0.1939
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.681
    Shell Resolution(Low) 2.8878
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 6866
    R-Factor(R-Work) 0.1902
    R-Factor(R-Free) 0.2103
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8878
    Shell Resolution(Low) 3.1781
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6895
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1781
    Shell Resolution(Low) 3.6372
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 6912
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.1837
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6372
    Shell Resolution(Low) 4.5797
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6907
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.1749
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5797
    Shell Resolution(Low) 29.2039
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6820
    R-Factor(R-Work) 0.1874
    R-Factor(R-Free) 0.1841
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 14.578
    f_angle_d 1.059
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7928
    Nucleic Acid Atoms 0
    Heterogen Atoms 112
    Solvent Atoms 889
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADX
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.8_1069)
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHENIX version: (phenix.refine: 1.8_1069)
    data collection ADX