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X-RAY DIFFRACTION
Materials and Methods page
4ID3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 291.0
    Details 20% PEG 2000, 0.1M HEPES , pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 32 α = 90
    b = 82.49 β = 91.49
    c = 32.71 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details Osmic blue
    Collection Date 2011-06-16
     
    Diffraction Radiation
    Monochromator GRAPHITE
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH3R
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.96
    Resolution(Low) 17.45
    Number Reflections(All) 33181
    Number Reflections(Observed) 11413
    Percent Possible(Observed) 94.1
    R Merge I(Observed) 0.027
    B(Isotropic) From Wilson Plot 30.4
    Redundancy 2.3
     
    High Resolution Shell Details
    Resolution(High) 1.96
    Resolution(Low) 2.07
    Percent Possible(All) 85.1
    R Merge I(Observed) 0.255
    Mean I Over Sigma(Observed) 4.7
    Redundancy 2.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9669
    Resolution(Low) 17.448
    Number of Reflections(all) 11404
    Number of Reflections(Observed) 11404
    Number of Reflections(R-Free) 559
    Percent Reflections(Observed) 94.12
    R-Factor(All) 0.192
    R-Factor(Observed) 0.192
    R-Work 0.1908
    R-Free 0.2332
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9669
    Shell Resolution(Low) 2.1637
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.2628
    R-Factor(R-Free) 0.3463
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1637
    Shell Resolution(Low) 2.4743
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2787
    R-Factor(R-Work) 0.2459
    R-Factor(R-Free) 0.2521
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4743
    Shell Resolution(Low) 3.1076
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.2311
    R-Factor(R-Free) 0.2546
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1076
    Shell Resolution(Low) 11.7087
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1439
    R-Factor(R-Free) 0.2045
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_dihedral_angle_d 11.17
    f_angle_d 1.096
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1428
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 108
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1051)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1051)
    model building PHASER
    data collection StructureStudio