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X-RAY DIFFRACTION
Materials and Methods page
4ICL
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.7
    Details 11% PEG 8000, 4% PEG 400, 50 MM IMIDAZOLE, 10 MM SPERMINE, 15 MM MGSO4, 100 MM AMMONIUM SULFATE, AND 5 MM TRIS(2-CARBOXYETHYL)PHOSPHINE, PH 6.7, VAPOR DIFFUSION, TEMPERATURE 277.0K , VAPOR DIFFUSION, HANGING DROP
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 163.05 α = 90
    b = 72.65 β = 100.85
    c = 109.48 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2008-12-20
     
    Diffraction Radiation
    Monochromator SI 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength 0.917
    Wavelength List 0.917
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -2.0
    Resolution(High) 1.8
    Resolution(Low) 50
    Number Reflections(All) 119988
    Number Reflections(Observed) 117469
    Percent Possible(Observed) 97.9
    R Merge I(Observed) 0.074
    Redundancy 4.4
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.83
    Percent Possible(All) 84.6
    R Merge I(Observed) 0.735
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.8
    Resolution(Low) 38.0
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 114627
    Number of Reflections(R-Free) 2123
    Percent Reflections(Observed) 98.41
    R-Factor(Observed) 0.1792
    R-Work 0.1788
    R-Free 0.1989
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.8391
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 6786
    R-Factor(R-Work) 0.2953
    R-Factor(R-Free) 0.3098
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8391
    Shell Resolution(Low) 1.8819
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 6799
    R-Factor(R-Work) 0.2716
    R-Factor(R-Free) 0.2703
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8819
    Shell Resolution(Low) 1.929
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6871
    R-Factor(R-Work) 0.2454
    R-Factor(R-Free) 0.2603
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.929
    Shell Resolution(Low) 1.9811
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6945
    R-Factor(R-Work) 0.2281
    R-Factor(R-Free) 0.2124
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9811
    Shell Resolution(Low) 2.0394
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6913
    R-Factor(R-Work) 0.2075
    R-Factor(R-Free) 0.2208
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0394
    Shell Resolution(Low) 2.1053
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6951
    R-Factor(R-Work) 0.1956
    R-Factor(R-Free) 0.2428
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1053
    Shell Resolution(Low) 2.1805
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 7004
    R-Factor(R-Work) 0.1888
    R-Factor(R-Free) 0.2352
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1805
    Shell Resolution(Low) 2.2678
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 7049
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.2262
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2678
    Shell Resolution(Low) 2.371
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 7001
    R-Factor(R-Work) 0.1781
    R-Factor(R-Free) 0.1889
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.371
    Shell Resolution(Low) 2.496
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 7094
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.2206
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.496
    Shell Resolution(Low) 2.6523
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 7074
    R-Factor(R-Work) 0.1751
    R-Factor(R-Free) 0.2079
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6523
    Shell Resolution(Low) 2.857
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 7098
    R-Factor(R-Work) 0.1806
    R-Factor(R-Free) 0.2222
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.857
    Shell Resolution(Low) 3.1444
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 7128
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2275
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1444
    Shell Resolution(Low) 3.5991
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 7165
    R-Factor(R-Work) 0.1757
    R-Factor(R-Free) 0.1977
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5991
    Shell Resolution(Low) 4.5333
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 7235
    R-Factor(R-Work) 0.1556
    R-Factor(R-Free) 0.1564
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5333
    Shell Resolution(Low) 38.0082
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 7223
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.1637
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.01
    f_chiral_restr 0.084
    f_dihedral_angle_d 14.68
    f_angle_d 1.441
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7929
    Nucleic Acid Atoms 0
    Heterogen Atoms 89
    Solvent Atoms 689
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADX
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.8_1069)
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHENIX version: (phenix.refine: 1.8_1069)
    data collection ADX