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X-RAY DIFFRACTION
Materials and Methods page
4ICG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 295.0
    Details 20% PEG 3350, 0.2M potassium chloride, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 77.88 α = 90
    b = 82.9 β = 90
    c = 47.13 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-04-14
     
    Diffraction Radiation
    Monochromator Si 111 Channel
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.979
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.9
    Resolution(Low) 50
    Number Reflections(Observed) 7129
    Percent Possible(Observed) 99.9
     
    High Resolution Shell Details
    Resolution(High) 2.9
    Resolution(Low) 3.0
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.9217
    Resolution(Low) 47.13
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 6183
    Number of Reflections(Observed) 6183
    Number of Reflections(R-Free) 626
    Percent Reflections(Observed) 88.05
    R-Factor(All) 0.2829
    R-Factor(Observed) 0.2829
    R-Work 0.2772
    R-Free 0.3315
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9217
    Shell Resolution(Low) 3.2157
    Number of Reflections(R-Free) 92
    Number of Reflections(R-Work) 826
    R-Factor(R-Work) 0.3741
    R-Factor(R-Free) 0.4379
    Percent Reflections(Observed) 54.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2157
    Shell Resolution(Low) 3.6809
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 1522
    R-Factor(R-Work) 0.3281
    R-Factor(R-Free) 0.3847
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6809
    Shell Resolution(Low) 4.6369
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 1554
    R-Factor(R-Work) 0.2576
    R-Factor(R-Free) 0.3103
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6369
    Shell Resolution(Low) 47.1361
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 1655
    R-Factor(R-Work) 0.2541
    R-Factor(R-Free) 0.3106
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_dihedral_angle_d 14.174
    f_angle_d 1.06
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1688
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building SOLVE
    data collection HKL-2000