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X-RAY DIFFRACTION
Materials and Methods page
4IC8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.5
    Temperature 296.0
    Details 30% PEG 200, 100mM MIB, pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 59.9 α = 90
    b = 93.22 β = 89.96
    c = 69.26 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 2M-F
    Collection Date 2012-07-31
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.0
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.52
    Observed Criterion Sigma(I) 2.52
    Resolution(High) 2.8
    Resolution(Low) 45.29
    Number Reflections(All) 18893
    Number Reflections(Observed) 18522
    Percent Possible(Observed) 98.0
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.87
    Percent Possible(All) 100.0
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.8
    Resolution(Low) 45.29
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 18893
    Number of Reflections(Observed) 18522
    Number of Reflections(R-Free) 953
    Percent Reflections(Observed) 98.07
    R-Factor(All) 0.2632
    R-Factor(Observed) 0.2632
    R-Work 0.2619
    R-Free 0.2898
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8
    Shell Resolution(Low) 2.9485
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.3254
    R-Factor(R-Free) 0.3461
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9485
    Shell Resolution(Low) 3.1332
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.3252
    R-Factor(R-Free) 0.367
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1332
    Shell Resolution(Low) 3.375
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.3012
    R-Factor(R-Free) 0.3425
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.375
    Shell Resolution(Low) 3.7144
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2543
    R-Factor(R-Work) 0.2738
    R-Factor(R-Free) 0.2854
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7144
    Shell Resolution(Low) 4.2514
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2197
    R-Factor(R-Work) 0.2517
    R-Factor(R-Free) 0.2918
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2514
    Shell Resolution(Low) 5.3544
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2562
    R-Factor(R-Work) 0.2313
    R-Factor(R-Free) 0.2642
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3544
    Shell Resolution(Low) 40.7643
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.2411
    R-Factor(R-Free) 0.2636
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.098
    f_dihedral_angle_d 18.041
    f_angle_d 1.519
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4807
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection XDS