X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 296.0
Details 48% PEG 200, 100mM MIB, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 296K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 69.37 α = 90
b = 69.37 β = 90
c = 271.24 γ = 90
Symmetry
Space Group P 43

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 2M-F -- 2012-07-31
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.0 SLS X06DA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 48.27 99.7 -- -- -- -- 39260 39147 2.4 2.4 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.67 98.62 -- -- -- 4.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.6 48.269 -- 1.35 39260 39029 1955 99.62 -- 0.213 0.2106 0.258 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.665 -- 135 2624 0.3124 0.4001 -- 98.0
X Ray Diffraction 2.665 2.7371 -- 138 2622 0.2992 0.3322 -- 99.0
X Ray Diffraction 2.7371 2.8176 -- 146 2631 0.2868 0.3758 -- 99.0
X Ray Diffraction 2.8176 2.9085 -- 148 2615 0.2811 0.3648 -- 100.0
X Ray Diffraction 2.9085 3.0125 -- 153 2658 0.2691 0.3324 -- 100.0
X Ray Diffraction 3.0125 3.1331 -- 136 2636 0.263 0.363 -- 100.0
X Ray Diffraction 3.1331 3.2756 -- 120 2691 0.2692 0.3012 -- 100.0
X Ray Diffraction 3.2756 3.4483 -- 128 2659 0.2357 0.2576 -- 100.0
X Ray Diffraction 3.4483 3.6642 -- 134 2670 0.221 0.2838 -- 100.0
X Ray Diffraction 3.6642 3.947 -- 145 2622 0.211 0.2603 -- 100.0
X Ray Diffraction 3.947 4.344 -- 157 2665 0.1851 0.2475 -- 100.0
X Ray Diffraction 4.344 4.9721 -- 137 2653 0.1699 0.1913 -- 100.0
X Ray Diffraction 4.9721 6.2621 -- 135 2661 0.1995 0.25 -- 100.0
X Ray Diffraction 6.2621 48.2773 -- 143 2667 0.1713 0.2022 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.011
f_chiral_restr 0.117
f_dihedral_angle_d 18.998
f_angle_d 1.584
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7249
Nucleic Acid Atoms 0
Heterogen Atoms 62
Solvent Atoms 83

Software

Computing
Computing Package Purpose
XDS Data Collection
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASER model building
XDS data collection