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X-RAY DIFFRACTION
Materials and Methods page
4IC7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 296.0
    Details 48% PEG 200, 100mM MIB, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 69.37 α = 90
    b = 69.37 β = 90
    c = 271.24 γ = 90
     
    Space Group
    Space Group Name:    P 43
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 2M-F
    Collection Date 2012-07-31
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.0
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.4
    Observed Criterion Sigma(I) 2.4
    Resolution(High) 2.6
    Resolution(Low) 48.27
    Number Reflections(All) 39260
    Number Reflections(Observed) 39147
    Percent Possible(Observed) 99.7
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.67
    Percent Possible(All) 98.62
    Redundancy 4.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 48.269
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 39260
    Number of Reflections(Observed) 39029
    Number of Reflections(R-Free) 1955
    Percent Reflections(Observed) 99.62
    R-Factor(Observed) 0.213
    R-Work 0.2106
    R-Free 0.258
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.665
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.3124
    R-Factor(R-Free) 0.4001
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.665
    Shell Resolution(Low) 2.7371
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2992
    R-Factor(R-Free) 0.3322
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7371
    Shell Resolution(Low) 2.8176
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2868
    R-Factor(R-Free) 0.3758
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8176
    Shell Resolution(Low) 2.9085
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2615
    R-Factor(R-Work) 0.2811
    R-Factor(R-Free) 0.3648
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9085
    Shell Resolution(Low) 3.0125
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2691
    R-Factor(R-Free) 0.3324
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0125
    Shell Resolution(Low) 3.1331
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.263
    R-Factor(R-Free) 0.363
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1331
    Shell Resolution(Low) 3.2756
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.2692
    R-Factor(R-Free) 0.3012
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2756
    Shell Resolution(Low) 3.4483
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2357
    R-Factor(R-Free) 0.2576
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4483
    Shell Resolution(Low) 3.6642
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.2838
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6642
    Shell Resolution(Low) 3.947
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.211
    R-Factor(R-Free) 0.2603
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.947
    Shell Resolution(Low) 4.344
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1851
    R-Factor(R-Free) 0.2475
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.344
    Shell Resolution(Low) 4.9721
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.1699
    R-Factor(R-Free) 0.1913
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9721
    Shell Resolution(Low) 6.2621
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1995
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2621
    Shell Resolution(Low) 48.2773
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.2022
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.011
    f_chiral_restr 0.117
    f_dihedral_angle_d 18.998
    f_angle_d 1.584
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7249
    Nucleic Acid Atoms 0
    Heterogen Atoms 62
    Solvent Atoms 83
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection XDS