X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.6
Temperature 295.0
Details 25% PEG 3350, 0.1M NaCitrate, 0.2M NaCl, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 86.15 α = 90
b = 197.76 β = 100.88
c = 89.41 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirrors 2012-10-30
CCD ADSC QUANTUM 210 mirrors 2012-10-30
Diffraction Radiation
Monochromator Protocol
Double Crystal SINGLE WAVELENGTH
Double Crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9794 APS 19-ID
SYNCHROTRON APS BEAMLINE 19-BM 1.738 APS 19-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.35 40 97.3 0.045 -- -- 3.7 121708 118972 1.7 2.0 49.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.35 2.39 94.5 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.35 40.0 2.0 1.7 100633 95585 5038 82.33 0.22 0.20533 0.20128 0.2487 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.347 2.408 -- 82 1689 0.21 0.322 -- 19.72
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 27.708
Anisotropic B[1][1] 0.0
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.37
Anisotropic B[2][2] 0.3
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.16
RMS Deviations
Key Refinement Restraint Deviation
r_mcbond_it 1.718
r_angle_refined_deg 2.092
r_scangle_it 6.285
r_mcbond_other 2.586
r_mcangle_it 3.029
r_angle_other_deg 1.315
r_dihedral_angle_3_deg 17.005
r_rigid_bond_restr 2.276
r_dihedral_angle_4_deg 19.791
r_bond_other_d 0.001
r_scbond_it 3.951
r_dihedral_angle_2_deg 34.563
r_bond_refined_d 0.022
r_gen_planes_refined 0.007
r_chiral_restr 0.17
r_dihedral_angle_1_deg 6.112
r_gen_planes_other 0.001
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 16077
Nucleic Acid Atoms 0
Heterogen Atoms 90
Solvent Atoms 292

Software

Computing
Computing Package Purpose
SBC-Collect Data Collection
HKL3000 Data Reduction (intensity integration)
HKL3000 Data Reduction (data scaling)
AUTORICKSHAW Structure Solution
REFMAC 5.5.0109 Structure Refinement
Software
Software Name Purpose
SBC-Collect data collection
AUTORICKSHAW model building
REFMAC version: 5.5.0109 refinement