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X-RAY DIFFRACTION
Materials and Methods page
4IBZ
  •   Crystallization Hide
    Crystallization Experiments
    Method Vapor diffusion, hanging drop
    pH 6.1
    Temperature 293.0
    Details 12% PEG 3350, 0.12M NH4-Acetate, pH 6.1, Vapor diffusion, hanging drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.74 α = 90
    b = 70.41 β = 89.92
    c = 84.58 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details TOROIDAL MIRROR
    Collection Date 2005-07-05
     
    Diffraction Radiation
    Monochromator SILICON (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength List 0.97590
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.92
    Resolution(Low) 27
    Number Reflections(Observed) 60012
    Percent Possible(Observed) 97.8
    R Merge I(Observed) 0.081
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.92
    Resolution(Low) 1.95
    Percent Possible(All) 81.2
    R Merge I(Observed) 0.356
    Redundancy 2.6
    Number Unique Reflections(All) 2501
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.92
    Resolution(Low) 26.692
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 59996
    Number of Reflections(Observed) 59996
    Number of Reflections(R-Free) 2544
    Percent Reflections(Observed) 97.44
    R-Factor(Observed) 0.1807
    R-Work 0.1792
    R-Free 0.2329
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 33.0886
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.92
    Shell Resolution(Low) 1.9602
    Number of Reflections(R-Free) 90
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.2881
    R-Factor(R-Free) 0.3133
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9602
    Shell Resolution(Low) 2.0002
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3146
    R-Factor(R-Work) 0.2649
    R-Factor(R-Free) 0.3097
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0002
    Shell Resolution(Low) 2.0437
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 3143
    R-Factor(R-Work) 0.2503
    R-Factor(R-Free) 0.2782
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0437
    Shell Resolution(Low) 2.0911
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 3222
    R-Factor(R-Work) 0.229
    R-Factor(R-Free) 0.3169
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0911
    Shell Resolution(Low) 2.1434
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3203
    R-Factor(R-Work) 0.2399
    R-Factor(R-Free) 0.304
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1434
    Shell Resolution(Low) 2.2012
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 3232
    R-Factor(R-Work) 0.2301
    R-Factor(R-Free) 0.2351
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2012
    Shell Resolution(Low) 2.2659
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 3179
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2785
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2659
    Shell Resolution(Low) 2.3389
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3221
    R-Factor(R-Work) 0.2213
    R-Factor(R-Free) 0.3016
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3389
    Shell Resolution(Low) 2.4223
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3196
    R-Factor(R-Work) 0.2206
    R-Factor(R-Free) 0.2931
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4223
    Shell Resolution(Low) 2.5191
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 3243
    R-Factor(R-Work) 0.2219
    R-Factor(R-Free) 0.2641
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5191
    Shell Resolution(Low) 2.6335
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3212
    R-Factor(R-Work) 0.2139
    R-Factor(R-Free) 0.2287
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6335
    Shell Resolution(Low) 2.7719
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 3255
    R-Factor(R-Work) 0.2049
    R-Factor(R-Free) 0.2546
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7719
    Shell Resolution(Low) 2.945
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3245
    R-Factor(R-Work) 0.1939
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.945
    Shell Resolution(Low) 3.1714
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3261
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.2444
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1714
    Shell Resolution(Low) 3.4887
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3255
    R-Factor(R-Work) 0.1524
    R-Factor(R-Free) 0.2017
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4887
    Shell Resolution(Low) 3.9894
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3245
    R-Factor(R-Work) 0.1292
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9894
    Shell Resolution(Low) 5.0107
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3305
    R-Factor(R-Work) 0.1132
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0107
    Shell Resolution(Low) 18.8974
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3316
    R-Factor(R-Work) 0.1439
    R-Factor(R-Free) 0.1612
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.575
    f_plane_restr 0.005
    f_chiral_restr 0.07
    f_angle_d 1.069
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5922
    Nucleic Acid Atoms 0
    Heterogen Atoms 88
    Solvent Atoms 613
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement MOLREP
    data reduction HKL