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X-RAY DIFFRACTION
Materials and Methods page
4IBT
  •   Crystallization Hide
    Crystallization Experiments
    Method Vapor diffusion, hanging drop
    pH 6.1
    Temperature 293.0
    Details 20% PEG 3350, 0.2M NaF, pH 6.1, Vapor diffusion, hanging drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.93 α = 90
    b = 70.21 β = 90.05
    c = 84.01 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details BLUE CONFOCAL MIRRORS
    Collection Date 2005-06-06
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH3R
    Wavelength List 1.54178
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.7
    Resolution(Low) 36
    Number Reflections(Observed) 82678
    Percent Possible(Observed) 93.6
    R Merge I(Observed) 0.054
    Redundancy 8.4
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.73
    Percent Possible(All) 89.3
    R Merge I(Observed) 0.537
    Redundancy 8.1
    Number Unique Reflections(All) 3910
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 35.882
    Cut-off Sigma(F) 1.39
    Number of Reflections(all) 82662
    Number of Reflections(Observed) 82662
    Number of Reflections(R-Free) 2599
    Percent Reflections(Observed) 93.5
    R-Factor(Observed) 0.1696
    R-Work 0.1695
    R-Free 0.1825
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 23.477
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.7322
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 4157
    R-Factor(R-Work) 0.2812
    R-Factor(R-Free) 0.344
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7322
    Shell Resolution(Low) 1.7676
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4260
    R-Factor(R-Work) 0.2529
    R-Factor(R-Free) 0.2512
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7676
    Shell Resolution(Low) 1.806
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 4276
    R-Factor(R-Work) 0.2294
    R-Factor(R-Free) 0.2266
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.806
    Shell Resolution(Low) 1.848
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 4334
    R-Factor(R-Work) 0.2181
    R-Factor(R-Free) 0.2875
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.848
    Shell Resolution(Low) 1.8943
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 4328
    R-Factor(R-Work) 0.2119
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8943
    Shell Resolution(Low) 1.9455
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4320
    R-Factor(R-Work) 0.1894
    R-Factor(R-Free) 0.2124
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9455
    Shell Resolution(Low) 2.0027
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4372
    R-Factor(R-Work) 0.1869
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0027
    Shell Resolution(Low) 2.0673
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 4382
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.2161
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0673
    Shell Resolution(Low) 2.1412
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 4426
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.1957
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1412
    Shell Resolution(Low) 2.2269
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4430
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.1983
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2269
    Shell Resolution(Low) 2.3282
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4500
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.1816
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3282
    Shell Resolution(Low) 2.4509
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4463
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.1967
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4509
    Shell Resolution(Low) 2.6044
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 4565
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.1977
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6044
    Shell Resolution(Low) 2.8054
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4566
    R-Factor(R-Work) 0.1704
    R-Factor(R-Free) 0.2071
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8054
    Shell Resolution(Low) 3.0876
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4609
    R-Factor(R-Work) 0.1649
    R-Factor(R-Free) 0.1742
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0876
    Shell Resolution(Low) 3.5339
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4625
    R-Factor(R-Work) 0.1541
    R-Factor(R-Free) 0.1454
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5339
    Shell Resolution(Low) 4.4505
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 4699
    R-Factor(R-Work) 0.1315
    R-Factor(R-Free) 0.1316
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4505
    Shell Resolution(Low) 32.3971
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 4830
    R-Factor(R-Work) 0.1407
    R-Factor(R-Free) 0.1668
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.074
    f_plane_restr 0.003
    f_chiral_restr 0.059
    f_angle_d 0.864
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6144
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 971
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1186)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser
    data reduction HKL