X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4
Temperature 277.0
Details 0.8M (NH4)2SO4, 0.1M Citrate pH 4.0, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 40.1 α = 99.81
b = 52.45 β = 87.5
c = 54.91 γ = 94.96
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD Flat mirror (vertical focusing); single crystal Si(111) bent monochromator (ho rizontal focusing) 2010-06-09
Diffraction Radiation
Monochromator Protocol
single crystal Si(111) bent single wavelength
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 -- SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.76 40.88 96.1 0.059 -- -- -- -- 41851 -- -3.0 19.456
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.76 1.82 93.5 0.562 -- 2.4 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.76 40.876 -- 0.0 -- 41847 2110 96.12 -- 0.163 0.1619 0.1844 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.76 1.81 -- 155 2851 0.2101 0.219 -- 96.12
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 30.3081
Anisotropic B[1][1] -3.7639
Anisotropic B[1][2] 2.597
Anisotropic B[1][3] -0.3676
Anisotropic B[2][2] 2.0682
Anisotropic B[2][3] 1.852
Anisotropic B[3][3] 1.6956
RMS Deviations
Key Refinement Restraint Deviation
t_other_torsion 2.77
t_omega_torsion 3.75
t_angle_deg 1.05
t_bond_d 0.01
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.233
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3791
Nucleic Acid Atoms 0
Heterogen Atoms 51
Solvent Atoms 342

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
PHASER Structure Solution
BUSTER 2.10.0 Structure Refinement
Software
Software Name Purpose
BUSTER-TNT version: 2.10.0 refinement
Xscale version: January 30, 2009 data processing
Phaser version: 2.3.0 molecular replacement
pdb_extract version: 3.10 data extraction
MOLPROBITY version: 3beta29 validation