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X-RAY DIFFRACTION
Materials and Methods page
4IA6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.9
    Temperature 298.0
    Details 37-38% MPD, 0.1M Hepes/KOH, 20mM NaBr, pH 7.9, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 165.1 α = 90
    b = 77.74 β = 90
    c = 104.81 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2008-12-19
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength List 0.97977
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.8
    Resolution(Low) 50
    Number Reflections(Observed) 122391
    Percent Possible(Observed) 97.6
    R Merge I(Observed) 0.096
    B(Isotropic) From Wilson Plot 23.685
    Redundancy 4.3
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.9
    Percent Possible(All) 84.1
    R Merge I(Observed) 0.652
    Mean I Over Sigma(Observed) 2.36
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 1.8
    Resolution(Low) 48.725
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 122324
    Number of Reflections(R-Free) 6030
    Percent Reflections(Observed) 97.56
    R-Factor(Observed) 0.1556
    R-Work 0.1537
    R-Free 0.1915
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.5473
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8
    Shell Resolution(Low) 1.8205
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2190
    R-Factor(R-Work) 0.2558
    R-Factor(R-Free) 0.269
    Percent Reflections(Observed) 56.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8205
    Shell Resolution(Low) 1.8419
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2848
    R-Factor(R-Work) 0.2428
    R-Factor(R-Free) 0.2974
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8419
    Shell Resolution(Low) 1.8643
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3999
    R-Factor(R-Work) 0.2274
    R-Factor(R-Free) 0.2464
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8643
    Shell Resolution(Low) 1.8879
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3894
    R-Factor(R-Work) 0.2138
    R-Factor(R-Free) 0.2541
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8879
    Shell Resolution(Low) 1.9128
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3933
    R-Factor(R-Work) 0.2089
    R-Factor(R-Free) 0.2528
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9128
    Shell Resolution(Low) 1.939
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3961
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.939
    Shell Resolution(Low) 1.9667
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3919
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.2036
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9667
    Shell Resolution(Low) 1.9961
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3928
    R-Factor(R-Work) 0.1923
    R-Factor(R-Free) 0.2412
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9961
    Shell Resolution(Low) 2.0272
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 3910
    R-Factor(R-Work) 0.1767
    R-Factor(R-Free) 0.2209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0272
    Shell Resolution(Low) 2.0605
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3967
    R-Factor(R-Work) 0.1697
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0605
    Shell Resolution(Low) 2.096
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3922
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.096
    Shell Resolution(Low) 2.1341
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3939
    R-Factor(R-Work) 0.161
    R-Factor(R-Free) 0.2133
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1341
    Shell Resolution(Low) 2.1752
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3953
    R-Factor(R-Work) 0.1602
    R-Factor(R-Free) 0.1971
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1752
    Shell Resolution(Low) 2.2196
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3938
    R-Factor(R-Work) 0.157
    R-Factor(R-Free) 0.2082
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2196
    Shell Resolution(Low) 2.2678
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3916
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2678
    Shell Resolution(Low) 2.3206
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3943
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.2153
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3206
    Shell Resolution(Low) 2.3786
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3976
    R-Factor(R-Work) 0.1535
    R-Factor(R-Free) 0.2258
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3786
    Shell Resolution(Low) 2.4429
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3951
    R-Factor(R-Work) 0.156
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4429
    Shell Resolution(Low) 2.5148
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3964
    R-Factor(R-Work) 0.1507
    R-Factor(R-Free) 0.2041
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5148
    Shell Resolution(Low) 2.596
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3953
    R-Factor(R-Work) 0.1418
    R-Factor(R-Free) 0.1922
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.596
    Shell Resolution(Low) 2.6888
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 3976
    R-Factor(R-Work) 0.1454
    R-Factor(R-Free) 0.1711
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6888
    Shell Resolution(Low) 2.7964
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3953
    R-Factor(R-Work) 0.1459
    R-Factor(R-Free) 0.1942
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7964
    Shell Resolution(Low) 2.9236
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3979
    R-Factor(R-Work) 0.1407
    R-Factor(R-Free) 0.1805
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9236
    Shell Resolution(Low) 3.0778
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 3982
    R-Factor(R-Work) 0.1424
    R-Factor(R-Free) 0.1718
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0778
    Shell Resolution(Low) 3.2706
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 4007
    R-Factor(R-Work) 0.1356
    R-Factor(R-Free) 0.1926
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2706
    Shell Resolution(Low) 3.523
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 4012
    R-Factor(R-Work) 0.1282
    R-Factor(R-Free) 0.1569
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.523
    Shell Resolution(Low) 3.8774
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 4008
    R-Factor(R-Work) 0.1222
    R-Factor(R-Free) 0.1605
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8774
    Shell Resolution(Low) 4.4382
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 4048
    R-Factor(R-Work) 0.1164
    R-Factor(R-Free) 0.1434
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4382
    Shell Resolution(Low) 5.5903
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 4091
    R-Factor(R-Work) 0.1419
    R-Factor(R-Free) 0.1815
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5903
    Shell Resolution(Low) 48.7427
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 4234
    R-Factor(R-Work) 0.1829
    R-Factor(R-Free) 0.1711
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.617
    f_plane_restr 0.006
    f_chiral_restr 0.092
    f_angle_d 1.376
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9213
    Nucleic Acid Atoms 0
    Heterogen Atoms 200
    Solvent Atoms 1389
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale