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X-RAY DIFFRACTION
Materials and Methods page
4I9Y
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 0.1 M TRIS-HCL, 0.2 M NaCl, 0.9 M K/Na Tartrate, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 104.06 α = 90
    b = 97.13 β = 117.38
    c = 108.15 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type PSI PILATUS 6M
    Collection Date 2012-04-04
     
    Diffraction Radiation
    Monochromator Liquid nitrogen-cooled double Si(111) crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL12-2
    Wavelength List 0.9795
    Site SSRL
    Beamline BL12-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.75
    Resolution(Low) 50
    Number Reflections(Observed) 188791
    Percent Possible(Observed) 97.7
    B(Isotropic) From Wilson Plot 20.34
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.75
    Resolution(Low) 48.566
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 188714
    Number of Reflections(R-Free) 9500
    Percent Reflections(Observed) 97.42
    R-Factor(Observed) 0.1248
    R-Work 0.123
    R-Free 0.1576
     
    Temperature Factor Modeling
    Mean Isotropic B Value 26.8421
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.75
    Shell Resolution(Low) 1.7653
    Number of Reflections(R-Free) 259
    Number of Reflections(R-Work) 4745
    R-Factor(R-Work) 0.2355
    R-Factor(R-Free) 0.2833
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7653
    Shell Resolution(Low) 1.7861
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 5608
    R-Factor(R-Work) 0.2234
    R-Factor(R-Free) 0.2851
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7861
    Shell Resolution(Low) 1.8079
    Number of Reflections(R-Free) 343
    Number of Reflections(R-Work) 6080
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2369
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8079
    Shell Resolution(Low) 1.8307
    Number of Reflections(R-Free) 322
    Number of Reflections(R-Work) 6072
    R-Factor(R-Work) 0.1795
    R-Factor(R-Free) 0.252
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8307
    Shell Resolution(Low) 1.8548
    Number of Reflections(R-Free) 341
    Number of Reflections(R-Work) 6053
    R-Factor(R-Work) 0.1662
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8548
    Shell Resolution(Low) 1.8802
    Number of Reflections(R-Free) 311
    Number of Reflections(R-Work) 6036
    R-Factor(R-Work) 0.166
    R-Factor(R-Free) 0.2175
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8802
    Shell Resolution(Low) 1.9071
    Number of Reflections(R-Free) 338
    Number of Reflections(R-Work) 6073
    R-Factor(R-Work) 0.1608
    R-Factor(R-Free) 0.2078
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9071
    Shell Resolution(Low) 1.9356
    Number of Reflections(R-Free) 309
    Number of Reflections(R-Work) 6109
    R-Factor(R-Work) 0.1546
    R-Factor(R-Free) 0.1806
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9356
    Shell Resolution(Low) 1.9658
    Number of Reflections(R-Free) 302
    Number of Reflections(R-Work) 5993
    R-Factor(R-Work) 0.1453
    R-Factor(R-Free) 0.1982
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9658
    Shell Resolution(Low) 1.998
    Number of Reflections(R-Free) 315
    Number of Reflections(R-Work) 5973
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.998
    Shell Resolution(Low) 2.0325
    Number of Reflections(R-Free) 312
    Number of Reflections(R-Work) 5922
    R-Factor(R-Work) 0.1387
    R-Factor(R-Free) 0.1763
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0325
    Shell Resolution(Low) 2.0695
    Number of Reflections(R-Free) 306
    Number of Reflections(R-Work) 5769
    R-Factor(R-Work) 0.1389
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0695
    Shell Resolution(Low) 2.1093
    Number of Reflections(R-Free) 300
    Number of Reflections(R-Work) 6063
    R-Factor(R-Work) 0.124
    R-Factor(R-Free) 0.1782
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1093
    Shell Resolution(Low) 2.1523
    Number of Reflections(R-Free) 327
    Number of Reflections(R-Work) 6048
    R-Factor(R-Work) 0.1113
    R-Factor(R-Free) 0.1607
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1523
    Shell Resolution(Low) 2.1991
    Number of Reflections(R-Free) 332
    Number of Reflections(R-Work) 6052
    R-Factor(R-Work) 0.1081
    R-Factor(R-Free) 0.1389
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1991
    Shell Resolution(Low) 2.2503
    Number of Reflections(R-Free) 333
    Number of Reflections(R-Work) 6072
    R-Factor(R-Work) 0.1059
    R-Factor(R-Free) 0.1516
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2503
    Shell Resolution(Low) 2.3066
    Number of Reflections(R-Free) 322
    Number of Reflections(R-Work) 6058
    R-Factor(R-Work) 0.1042
    R-Factor(R-Free) 0.1494
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3066
    Shell Resolution(Low) 2.3689
    Number of Reflections(R-Free) 366
    Number of Reflections(R-Work) 6019
    R-Factor(R-Work) 0.1024
    R-Factor(R-Free) 0.1517
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3689
    Shell Resolution(Low) 2.4386
    Number of Reflections(R-Free) 284
    Number of Reflections(R-Work) 5949
    R-Factor(R-Work) 0.1048
    R-Factor(R-Free) 0.1571
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4386
    Shell Resolution(Low) 2.5173
    Number of Reflections(R-Free) 307
    Number of Reflections(R-Work) 5766
    R-Factor(R-Work) 0.1058
    R-Factor(R-Free) 0.152
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5173
    Shell Resolution(Low) 2.6073
    Number of Reflections(R-Free) 316
    Number of Reflections(R-Work) 6117
    R-Factor(R-Work) 0.1117
    R-Factor(R-Free) 0.1512
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6073
    Shell Resolution(Low) 2.7117
    Number of Reflections(R-Free) 323
    Number of Reflections(R-Work) 6103
    R-Factor(R-Work) 0.1143
    R-Factor(R-Free) 0.1426
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7117
    Shell Resolution(Low) 2.8351
    Number of Reflections(R-Free) 312
    Number of Reflections(R-Work) 6111
    R-Factor(R-Work) 0.1203
    R-Factor(R-Free) 0.1635
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8351
    Shell Resolution(Low) 2.9845
    Number of Reflections(R-Free) 343
    Number of Reflections(R-Work) 6060
    R-Factor(R-Work) 0.1235
    R-Factor(R-Free) 0.1648
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9845
    Shell Resolution(Low) 3.1715
    Number of Reflections(R-Free) 320
    Number of Reflections(R-Work) 6011
    R-Factor(R-Work) 0.1215
    R-Factor(R-Free) 0.1533
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1715
    Shell Resolution(Low) 3.4163
    Number of Reflections(R-Free) 314
    Number of Reflections(R-Work) 5916
    R-Factor(R-Work) 0.1119
    R-Factor(R-Free) 0.1362
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4163
    Shell Resolution(Low) 3.76
    Number of Reflections(R-Free) 321
    Number of Reflections(R-Work) 6124
    R-Factor(R-Work) 0.1059
    R-Factor(R-Free) 0.1374
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.76
    Shell Resolution(Low) 4.3038
    Number of Reflections(R-Free) 321
    Number of Reflections(R-Work) 6125
    R-Factor(R-Work) 0.1041
    R-Factor(R-Free) 0.1258
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3038
    Shell Resolution(Low) 5.4212
    Number of Reflections(R-Free) 332
    Number of Reflections(R-Work) 5976
    R-Factor(R-Work) 0.1017
    R-Factor(R-Free) 0.1183
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4212
    Shell Resolution(Low) 48.5848
    Number of Reflections(R-Free) 292
    Number of Reflections(R-Work) 6211
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.1804
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_dihedral_angle_d 12.756
    f_angle_d 1.164
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7740
    Nucleic Acid Atoms 0
    Heterogen Atoms 162
    Solvent Atoms 1533
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser