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X-RAY DIFFRACTION
Materials and Methods page
4I9Q
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.6
    Temperature 298.0
    Details 10% PEG 8000, 0.2 M (NH4)2SO4 and 0.1 M sodium citrate (pH 5.6), VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.78 α = 90
    b = 119.41 β = 90.26
    c = 146.02 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Collection Date 2012-11-20
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.1
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.3
    Resolution(Low) 39.12
    Number Reflections(Observed) 110655
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 38.403
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 110586
    Number of Reflections(R-Free) 5526
    Percent Reflections(Observed) 98.52
    R-Factor(Observed) 0.2537
    R-Work 0.2519
    R-Free 0.2871
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3261
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3466
    R-Factor(R-Work) 0.2664
    R-Factor(R-Free) 0.2935
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3261
    Shell Resolution(Low) 2.3535
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3527
    R-Factor(R-Work) 0.2685
    R-Factor(R-Free) 0.3685
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3535
    Shell Resolution(Low) 2.3822
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3566
    R-Factor(R-Work) 0.2703
    R-Factor(R-Free) 0.3442
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3822
    Shell Resolution(Low) 2.4123
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3486
    R-Factor(R-Work) 0.2783
    R-Factor(R-Free) 0.3312
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4123
    Shell Resolution(Low) 2.4441
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3539
    R-Factor(R-Work) 0.2704
    R-Factor(R-Free) 0.3463
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4441
    Shell Resolution(Low) 2.4776
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3527
    R-Factor(R-Work) 0.2694
    R-Factor(R-Free) 0.3127
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4776
    Shell Resolution(Low) 2.5129
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3508
    R-Factor(R-Work) 0.2612
    R-Factor(R-Free) 0.338
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5129
    Shell Resolution(Low) 2.5504
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 3560
    R-Factor(R-Work) 0.2649
    R-Factor(R-Free) 0.3165
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5504
    Shell Resolution(Low) 2.5903
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3506
    R-Factor(R-Work) 0.2608
    R-Factor(R-Free) 0.3105
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5903
    Shell Resolution(Low) 2.6327
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3588
    R-Factor(R-Work) 0.2659
    R-Factor(R-Free) 0.309
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6327
    Shell Resolution(Low) 2.6781
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3484
    R-Factor(R-Work) 0.2704
    R-Factor(R-Free) 0.2934
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6781
    Shell Resolution(Low) 2.7268
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3587
    R-Factor(R-Work) 0.2705
    R-Factor(R-Free) 0.3359
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7268
    Shell Resolution(Low) 2.7793
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3500
    R-Factor(R-Work) 0.2731
    R-Factor(R-Free) 0.332
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7793
    Shell Resolution(Low) 2.836
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3576
    R-Factor(R-Work) 0.2714
    R-Factor(R-Free) 0.3293
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.836
    Shell Resolution(Low) 2.8976
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3508
    R-Factor(R-Work) 0.2754
    R-Factor(R-Free) 0.3094
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8976
    Shell Resolution(Low) 2.965
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3514
    R-Factor(R-Work) 0.2759
    R-Factor(R-Free) 0.3359
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.965
    Shell Resolution(Low) 3.0391
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3517
    R-Factor(R-Work) 0.2768
    R-Factor(R-Free) 0.3167
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0391
    Shell Resolution(Low) 3.1212
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3529
    R-Factor(R-Work) 0.2744
    R-Factor(R-Free) 0.3376
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1212
    Shell Resolution(Low) 3.213
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3525
    R-Factor(R-Work) 0.2747
    R-Factor(R-Free) 0.334
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.213
    Shell Resolution(Low) 3.3167
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 3444
    R-Factor(R-Work) 0.2714
    R-Factor(R-Free) 0.2891
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3167
    Shell Resolution(Low) 3.4352
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3428
    R-Factor(R-Work) 0.2605
    R-Factor(R-Free) 0.3106
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4352
    Shell Resolution(Low) 3.5726
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3460
    R-Factor(R-Work) 0.2613
    R-Factor(R-Free) 0.2943
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5726
    Shell Resolution(Low) 3.7351
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3443
    R-Factor(R-Work) 0.2621
    R-Factor(R-Free) 0.3093
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7351
    Shell Resolution(Low) 3.9318
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3409
    R-Factor(R-Work) 0.2447
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9318
    Shell Resolution(Low) 4.1779
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3444
    R-Factor(R-Work) 0.2352
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1779
    Shell Resolution(Low) 4.5
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3439
    R-Factor(R-Work) 0.2346
    R-Factor(R-Free) 0.2494
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5
    Shell Resolution(Low) 4.952
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3492
    R-Factor(R-Work) 0.223
    R-Factor(R-Free) 0.2555
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.952
    Shell Resolution(Low) 5.6666
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3473
    R-Factor(R-Work) 0.2265
    R-Factor(R-Free) 0.2724
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6666
    Shell Resolution(Low) 7.1319
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3463
    R-Factor(R-Work) 0.2446
    R-Factor(R-Free) 0.2527
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.1319
    Shell Resolution(Low) 38.408
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3552
    R-Factor(R-Work) 0.2156
    R-Factor(R-Free) 0.2261
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.051
    f_dihedral_angle_d 15.688
    f_angle_d 0.781
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13979
    Nucleic Acid Atoms 1234
    Heterogen Atoms 128
    Solvent Atoms 398
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1284)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1227)
    model building PHASER
    data collection CBASS