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X-RAY DIFFRACTION
Materials and Methods page
4I9L
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.6
    Details 1.65 M AMMONIUM SULPHATE, 0.01 M MAGNESIUM CHLORIDE, 0.05 M SODIUM CITRATE DIHYDROGEN, PH 5.6, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 116.88 α = 90
    b = 199.37 β = 90
    c = 80.82 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2011-06-16
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X12C
    Wavelength 1.0000
    Site NSLS
    Beamline X12C
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.6
    Resolution(Low) 50
    Number Reflections(Observed) 59560
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.14
    Redundancy 6.2
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.7
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.829
    Mean I Over Sigma(Observed) 2.5
    R-Sym I(Observed) 0.829
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 33.24
    Cut-off Sigma(F) 0.09
    Number of Reflections(Observed) 52147
    Number of Reflections(R-Free) 1732
    Percent Reflections(Observed) 86.8
    R-Factor(Observed) 0.216
    R-Work 0.214
    R-Free 0.249
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.5895
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 7.7354
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.1459
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.56
    Shell Resolution(Low) 2.6581
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 3190
    R-Factor(R-Work) 0.31
    R-Factor(R-Free) 0.3744
    Percent Reflections(Observed) 67.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6581
    Shell Resolution(Low) 2.7439
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 3617
    R-Factor(R-Work) 0.3046
    R-Factor(R-Free) 0.3848
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7439
    Shell Resolution(Low) 2.8419
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 3863
    R-Factor(R-Work) 0.3014
    R-Factor(R-Free) 0.3388
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8419
    Shell Resolution(Low) 2.9556
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 3876
    R-Factor(R-Work) 0.2861
    R-Factor(R-Free) 0.3401
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9556
    Shell Resolution(Low) 3.09
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4147
    R-Factor(R-Work) 0.274
    R-Factor(R-Free) 0.28
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.09
    Shell Resolution(Low) 3.2528
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 4201
    R-Factor(R-Work) 0.2699
    R-Factor(R-Free) 0.3145
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2528
    Shell Resolution(Low) 3.4564
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 4090
    R-Factor(R-Work) 0.2526
    R-Factor(R-Free) 0.2871
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4564
    Shell Resolution(Low) 3.723
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 4340
    R-Factor(R-Work) 0.2233
    R-Factor(R-Free) 0.2992
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.723
    Shell Resolution(Low) 4.097
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 4529
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2285
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.097
    Shell Resolution(Low) 4.6884
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 4699
    R-Factor(R-Work) 0.1572
    R-Factor(R-Free) 0.2042
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6884
    Shell Resolution(Low) 5.9016
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 4855
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.1878
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9016
    Shell Resolution(Low) 33.2405
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 5008
    R-Factor(R-Work) 0.1996
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.068
    f_dihedral_angle_d 16.806
    f_angle_d 1.016
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7368
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 220
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP
    data collection CBASS