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X-RAY DIFFRACTION
Materials and Methods page
4I8C
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.7
    Temperature 293.0
    Details 1.5M Ammonium sulfate, 0.1M sodium acetate, pH 4.7, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 158.63 α = 90
    b = 158.63 β = 90
    c = 135.82 γ = 120
     
    Space Group
    Space Group Name:    P 62
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2012-09-28
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM30A
    Wavelength List 0.9798
    Site ESRF
    Beamline BM30A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.5
    Resolution(Low) 48.5
    Number Reflections(Observed) 66527
    Percent Possible(Observed) 98.0
    Redundancy 2.58
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.6
    Percent Possible(All) 96.4
    Mean I Over Sigma(Observed) 2.34
    R-Sym I(Observed) 0.401
    Redundancy 2.58
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.503
    Resolution(Low) 48.5
    Cut-off Sigma(F) 1.06
    Number of Reflections(Observed) 66526
    Number of Reflections(R-Free) 3324
    Percent Reflections(Observed) 98.29
    R-Factor(Observed) 0.1907
    R-Work 0.1885
    R-Free 0.2339
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.503
    Shell Resolution(Low) 2.5314
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 4121
    R-Factor(R-Work) 0.2584
    R-Factor(R-Free) 0.3065
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5314
    Shell Resolution(Low) 2.5612
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 4205
    R-Factor(R-Work) 0.2553
    R-Factor(R-Free) 0.2876
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5612
    Shell Resolution(Low) 2.5925
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 4118
    R-Factor(R-Work) 0.2571
    R-Factor(R-Free) 0.3333
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5925
    Shell Resolution(Low) 2.6253
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4121
    R-Factor(R-Work) 0.2604
    R-Factor(R-Free) 0.3465
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6253
    Shell Resolution(Low) 2.6598
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4186
    R-Factor(R-Work) 0.2449
    R-Factor(R-Free) 0.2903
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6598
    Shell Resolution(Low) 2.6962
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 4039
    R-Factor(R-Work) 0.2496
    R-Factor(R-Free) 0.2997
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6962
    Shell Resolution(Low) 2.7348
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 4177
    R-Factor(R-Work) 0.2536
    R-Factor(R-Free) 0.299
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7348
    Shell Resolution(Low) 2.7756
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 4173
    R-Factor(R-Work) 0.2588
    R-Factor(R-Free) 0.3517
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7756
    Shell Resolution(Low) 2.8189
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 4109
    R-Factor(R-Work) 0.2454
    R-Factor(R-Free) 0.3117
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8189
    Shell Resolution(Low) 2.8652
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4137
    R-Factor(R-Work) 0.2453
    R-Factor(R-Free) 0.3216
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8652
    Shell Resolution(Low) 2.9145
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 4129
    R-Factor(R-Work) 0.2373
    R-Factor(R-Free) 0.2716
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9145
    Shell Resolution(Low) 2.9675
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4147
    R-Factor(R-Work) 0.2306
    R-Factor(R-Free) 0.2971
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9675
    Shell Resolution(Low) 3.0246
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 4163
    R-Factor(R-Work) 0.2451
    R-Factor(R-Free) 0.282
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0246
    Shell Resolution(Low) 3.0863
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4152
    R-Factor(R-Work) 0.2344
    R-Factor(R-Free) 0.3399
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0863
    Shell Resolution(Low) 3.1534
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4111
    R-Factor(R-Work) 0.2221
    R-Factor(R-Free) 0.3161
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1534
    Shell Resolution(Low) 3.2268
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 4126
    R-Factor(R-Work) 0.2323
    R-Factor(R-Free) 0.2995
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2268
    Shell Resolution(Low) 3.3075
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 4117
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.2659
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3075
    Shell Resolution(Low) 3.3969
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4088
    R-Factor(R-Work) 0.2149
    R-Factor(R-Free) 0.3053
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3969
    Shell Resolution(Low) 3.4968
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4044
    R-Factor(R-Work) 0.2054
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4968
    Shell Resolution(Low) 3.6096
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 4140
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2652
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6096
    Shell Resolution(Low) 3.7386
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 4011
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2809
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7386
    Shell Resolution(Low) 3.8882
    Number of Reflections(R-Free) 216
    Number of Reflections(R-Work) 4053
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2352
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8882
    Shell Resolution(Low) 4.0651
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 4067
    R-Factor(R-Work) 0.1712
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0651
    Shell Resolution(Low) 4.2793
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4079
    R-Factor(R-Work) 0.1576
    R-Factor(R-Free) 0.2099
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2793
    Shell Resolution(Low) 4.5472
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 4103
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5472
    Shell Resolution(Low) 4.898
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 4052
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.1747
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.898
    Shell Resolution(Low) 5.3903
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 4136
    R-Factor(R-Work) 0.1419
    R-Factor(R-Free) 0.1608
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3903
    Shell Resolution(Low) 6.169
    Number of Reflections(R-Free) 219
    Number of Reflections(R-Work) 4114
    R-Factor(R-Work) 0.1492
    R-Factor(R-Free) 0.2015
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.169
    Shell Resolution(Low) 7.7671
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 4057
    R-Factor(R-Work) 0.141
    R-Factor(R-Free) 0.1564
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.7671
    Shell Resolution(Low) 48.5095
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3840
    R-Factor(R-Work) 0.1441
    R-Factor(R-Free) 0.1476
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 13.676
    f_angle_d 1.091
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11859
    Nucleic Acid Atoms 0
    Heterogen Atoms 192
    Solvent Atoms 329
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MX CUBE
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building Phaser
    data collection MX version: CUBE