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X-RAY DIFFRACTION
Materials and Methods page
4I7T
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 4.5
    Temperature 277.0
    Details 0.1 M sodium acetate, pH 4.5, 30% (w/v) PEG-6000, 0.3 M LiSO4, 3% (w/v) TMAO, 50 mM 2-mercaptoethanol, 50 mM 2-hydroxyethyl disulfide, vapor diffusion, hanging drop, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.06 α = 90
    b = 75.81 β = 93.11
    c = 52.71 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-06-02
     
    Diffraction Radiation
    Monochromator two flat Si(111) crystals, mounted in a model DCM from Khozu
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 1.116
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.55
    Resolution(Low) 47.99
    Number Reflections(Observed) 52337
    Percent Possible(Observed) 95.7
    R Merge I(Observed) 0.052
    B(Isotropic) From Wilson Plot 21.494
     
    High Resolution Shell Details
    Resolution(High) 1.55
    Resolution(Low) 1.63
    Percent Possible(All) 92.3
    R Merge I(Observed) 0.367
    Mean I Over Sigma(Observed) 3.07
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.55
    Resolution(Low) 47.989
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 52336
    Number of Reflections(R-Free) 2103
    Percent Reflections(Observed) 95.66
    R-Factor(Observed) 0.1757
    R-Work 0.1747
    R-Free 0.1985
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 16.6634
    Anisotropic B[1][1] -1.6965
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.3838
    Anisotropic B[2][2] 1.7092
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.0127
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.55
    Shell Resolution(Low) 1.5861
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2962
    R-Factor(R-Work) 0.284
    R-Factor(R-Free) 0.2566
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5861
    Shell Resolution(Low) 1.6257
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3410
    R-Factor(R-Work) 0.2595
    R-Factor(R-Free) 0.3008
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6257
    Shell Resolution(Low) 1.6697
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3460
    R-Factor(R-Work) 0.2361
    R-Factor(R-Free) 0.2706
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6697
    Shell Resolution(Low) 1.7188
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3453
    R-Factor(R-Work) 0.2115
    R-Factor(R-Free) 0.2564
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7188
    Shell Resolution(Low) 1.7743
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3457
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2211
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7743
    Shell Resolution(Low) 1.8377
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3413
    R-Factor(R-Work) 0.1746
    R-Factor(R-Free) 0.2076
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8377
    Shell Resolution(Low) 1.9113
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3436
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.1976
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9113
    Shell Resolution(Low) 1.9983
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3422
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.1895
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9983
    Shell Resolution(Low) 2.1036
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3437
    R-Factor(R-Work) 0.1643
    R-Factor(R-Free) 0.2052
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1036
    Shell Resolution(Low) 2.2354
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3391
    R-Factor(R-Work) 0.1617
    R-Factor(R-Free) 0.19
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2354
    Shell Resolution(Low) 2.408
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3360
    R-Factor(R-Work) 0.1587
    R-Factor(R-Free) 0.1973
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.408
    Shell Resolution(Low) 2.6503
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3354
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6503
    Shell Resolution(Low) 3.0338
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3287
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.1897
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0338
    Shell Resolution(Low) 3.822
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3227
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.1621
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.822
    Shell Resolution(Low) 48.0123
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 3164
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 88.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.481
    f_plane_restr 0.011
    f_chiral_restr 0.142
    f_angle_d 1.941
    f_bond_d 0.021
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2743
    Nucleic Acid Atoms 0
    Heterogen Atoms 77
    Solvent Atoms 320
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale