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X-RAY DIFFRACTION
Materials and Methods page
4I7Q
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 4.5
    Temperature 277.0
    Details 0.1 M sodium acetate, pH 4.5, 30% (w/v) PEG-6000, 0.3 M LiSO4, 3% (w/v) TMAO, 50 mM 2-mercaptoethanol, 50 mM 2-hydroxyethyl disulfide, vapor diffusion, hanging drop, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.57 α = 90
    b = 75.31 β = 93.28
    c = 52.65 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-12-09
     
    Diffraction Radiation
    Monochromator two flat Si(111) crystals, mounted in a model DCM from Khozu
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 1.116
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.58
    Resolution(Low) 48.49
    Number Reflections(Observed) 50444
    Percent Possible(Observed) 97.3
    R Merge I(Observed) 0.053
    B(Isotropic) From Wilson Plot 20.165
     
    High Resolution Shell Details
    Resolution(High) 1.58
    Resolution(Low) 1.67
    Percent Possible(All) 99.5
    R Merge I(Observed) 0.307
    Mean I Over Sigma(Observed) 3.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.58
    Resolution(Low) 48.491
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 50441
    Number of Reflections(R-Free) 2033
    Percent Reflections(Observed) 97.29
    R-Factor(Observed) 0.1894
    R-Work 0.1884
    R-Free 0.2132
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 15.7051
    Anisotropic B[1][1] 1.4008
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.7147
    Anisotropic B[2][2] -0.8829
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.5179
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.58
    Shell Resolution(Low) 1.6168
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 3281
    R-Factor(R-Work) 0.2371
    R-Factor(R-Free) 0.2505
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6168
    Shell Resolution(Low) 1.6572
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3280
    R-Factor(R-Work) 0.2236
    R-Factor(R-Free) 0.256
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6572
    Shell Resolution(Low) 1.702
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3296
    R-Factor(R-Work) 0.2218
    R-Factor(R-Free) 0.2546
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.702
    Shell Resolution(Low) 1.7521
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3278
    R-Factor(R-Work) 0.2107
    R-Factor(R-Free) 0.2668
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7521
    Shell Resolution(Low) 1.8086
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3248
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8086
    Shell Resolution(Low) 1.8733
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 3297
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2164
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8733
    Shell Resolution(Low) 1.9483
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3304
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2348
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9483
    Shell Resolution(Low) 2.037
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 3262
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2141
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.037
    Shell Resolution(Low) 2.1444
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3223
    R-Factor(R-Work) 0.1814
    R-Factor(R-Free) 0.2117
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1444
    Shell Resolution(Low) 2.2787
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3261
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2212
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2787
    Shell Resolution(Low) 2.4546
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 3212
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.2128
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4546
    Shell Resolution(Low) 2.7016
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3190
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2016
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7016
    Shell Resolution(Low) 3.0925
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 3144
    R-Factor(R-Work) 0.1914
    R-Factor(R-Free) 0.2072
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0925
    Shell Resolution(Low) 3.896
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 3092
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.1824
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.896
    Shell Resolution(Low) 48.5134
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 3040
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.2018
    Percent Reflections(Observed) 90.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.267
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_angle_d 1.256
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2724
    Nucleic Acid Atoms 0
    Heterogen Atoms 94
    Solvent Atoms 282
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale