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X-RAY DIFFRACTION
Materials and Methods page
4I7O
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 4.5
    Temperature 277.0
    Details 0.1 M sodium acetate, pH 4.5, 30% (w/v) PEG-6000, 0.3 M LiSO4, 3% (w/v) TMAO, 50 mM 2-mercaptoethanol, 50 mM 2-hydroxyethyl disulfide, vapor diffusion, hanging drop, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.32 α = 90
    b = 75.34 β = 93.22
    c = 52.76 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-12-09
     
    Diffraction Radiation
    Monochromator two flat Si(111) crystals, mounted in a model DCM from Khozu
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 1.116
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.73
    Resolution(Low) 48.24
    Number Reflections(Observed) 37589
    Percent Possible(Observed) 95.3
    R Merge I(Observed) 0.056
    B(Isotropic) From Wilson Plot 22.137
     
    High Resolution Shell Details
    Resolution(High) 1.73
    Resolution(Low) 1.82
    Percent Possible(All) 97.8
    R Merge I(Observed) 0.356
    Mean I Over Sigma(Observed) 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.73
    Resolution(Low) 48.244
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 37583
    Number of Reflections(R-Free) 1499
    Percent Reflections(Observed) 95.25
    R-Factor(Observed) 0.1694
    R-Work 0.1684
    R-Free 0.194
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 16.7954
    Anisotropic B[1][1] -1.1573
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.4489
    Anisotropic B[2][2] 1.1863
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.0291
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.73
    Shell Resolution(Low) 1.7859
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3359
    R-Factor(R-Work) 0.2408
    R-Factor(R-Free) 0.271
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7859
    Shell Resolution(Low) 1.8497
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3322
    R-Factor(R-Work) 0.2166
    R-Factor(R-Free) 0.2485
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8497
    Shell Resolution(Low) 1.9237
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3340
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.259
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9237
    Shell Resolution(Low) 2.0113
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3333
    R-Factor(R-Work) 0.1744
    R-Factor(R-Free) 0.1973
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0113
    Shell Resolution(Low) 2.1173
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 3312
    R-Factor(R-Work) 0.1558
    R-Factor(R-Free) 0.2008
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1173
    Shell Resolution(Low) 2.25
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 3275
    R-Factor(R-Work) 0.156
    R-Factor(R-Free) 0.1911
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.25
    Shell Resolution(Low) 2.4237
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3314
    R-Factor(R-Work) 0.1565
    R-Factor(R-Free) 0.2087
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4237
    Shell Resolution(Low) 2.6676
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 3260
    R-Factor(R-Work) 0.1654
    R-Factor(R-Free) 0.1959
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6676
    Shell Resolution(Low) 3.0536
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 3230
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.1854
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0536
    Shell Resolution(Low) 3.8469
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 3186
    R-Factor(R-Work) 0.1558
    R-Factor(R-Free) 0.1769
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8469
    Shell Resolution(Low) 48.2625
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 3153
    R-Factor(R-Work) 0.16
    R-Factor(R-Free) 0.1558
    Percent Reflections(Observed) 90.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.054
    f_plane_restr 0.003
    f_chiral_restr 0.058
    f_angle_d 0.974
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2736
    Nucleic Acid Atoms 0
    Heterogen Atoms 90
    Solvent Atoms 286
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale