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X-RAY DIFFRACTION
Materials and Methods page
4I7N
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 4.5
    Temperature 277.0
    Details 0.1 M sodium acetate, pH 4.5, 30% (w/v) PEG-6000, 0.3 M LiSO4, 3% (w/v) TMAO, 50 mM 2-mercaptoethanol, 50 mM 2-hydroxyethyl disulfide, vapor diffusion, hanging drop, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.63 α = 90
    b = 75.14 β = 93.18
    c = 52.72 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-06-02
     
    Diffraction Radiation
    Monochromator two flat Si(111) crystals, mounted in a model DCM from Khozu
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 1.116
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.58
    Resolution(Low) 48.56
    Number Reflections(Observed) 50324
    Percent Possible(Observed) 97.0
    R Merge I(Observed) 0.051
    B(Isotropic) From Wilson Plot 21.265
     
    High Resolution Shell Details
    Resolution(High) 1.58
    Resolution(Low) 1.67
    Percent Possible(All) 91.9
    R Merge I(Observed) 0.378
    Mean I Over Sigma(Observed) 2.32
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.58
    Resolution(Low) 48.555
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 50322
    Number of Reflections(R-Free) 2006
    Percent Reflections(Observed) 97.02
    R-Factor(Observed) 0.1758
    R-Work 0.1747
    R-Free 0.2017
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 16.1224
    Anisotropic B[1][1] 1.4231
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.7275
    Anisotropic B[2][2] -0.5952
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.8279
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.58
    Shell Resolution(Low) 1.6195
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 3058
    R-Factor(R-Work) 0.2825
    R-Factor(R-Free) 0.3398
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6195
    Shell Resolution(Low) 1.6633
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3404
    R-Factor(R-Work) 0.2513
    R-Factor(R-Free) 0.2633
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6633
    Shell Resolution(Low) 1.7123
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3512
    R-Factor(R-Work) 0.23
    R-Factor(R-Free) 0.2992
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7123
    Shell Resolution(Low) 1.7675
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3514
    R-Factor(R-Work) 0.2042
    R-Factor(R-Free) 0.2608
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7675
    Shell Resolution(Low) 1.8307
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3542
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2066
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8307
    Shell Resolution(Low) 1.904
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3507
    R-Factor(R-Work) 0.1658
    R-Factor(R-Free) 0.2055
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.904
    Shell Resolution(Low) 1.9907
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3507
    R-Factor(R-Work) 0.1626
    R-Factor(R-Free) 0.207
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9907
    Shell Resolution(Low) 2.0956
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 3505
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.1845
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0956
    Shell Resolution(Low) 2.2269
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3507
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.1941
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2269
    Shell Resolution(Low) 2.3988
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3484
    R-Factor(R-Work) 0.16
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3988
    Shell Resolution(Low) 2.6402
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3475
    R-Factor(R-Work) 0.1636
    R-Factor(R-Free) 0.2026
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6402
    Shell Resolution(Low) 3.0222
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3458
    R-Factor(R-Work) 0.1767
    R-Factor(R-Free) 0.1845
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0222
    Shell Resolution(Low) 3.8075
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3432
    R-Factor(R-Work) 0.1618
    R-Factor(R-Free) 0.1752
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8075
    Shell Resolution(Low) 48.5779
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3411
    R-Factor(R-Work) 0.1675
    R-Factor(R-Free) 0.1711
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 13.464
    f_plane_restr 0.008
    f_chiral_restr 0.106
    f_angle_d 1.564
    f_bond_d 0.017
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2739
    Nucleic Acid Atoms 0
    Heterogen Atoms 86
    Solvent Atoms 302
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale