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X-RAY DIFFRACTION
Materials and Methods page
4I7K
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 4.5
    Temperature 277.0
    Details 0.1 M sodium acetate, pH 4.5, 30% (w/v) PEG-6000, 0.3 M LiSO4, 3% (w/v) TMAO, 50 mM 2-mercaptoethanol, 50 mM 2-hydroxyethyl disulfide, vapor diffusion, hanging drop, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.32 α = 90
    b = 75.55 β = 93.21
    c = 52.76 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-10-20
     
    Diffraction Radiation
    Monochromator two flat Si(111) crystals, mounted in a model DCM from Khozu
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 1.116
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.72
    Resolution(Low) 48.24
    Number Reflections(Observed) 39518
    Percent Possible(Observed) 98.2
    R Merge I(Observed) 0.064
    B(Isotropic) From Wilson Plot 21.122
     
    High Resolution Shell Details
    Resolution(High) 1.72
    Resolution(Low) 1.81
    Percent Possible(All) 99.2
    R Merge I(Observed) 0.358
    Mean I Over Sigma(Observed) 3.01
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.72
    Resolution(Low) 48.244
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 39514
    Number of Reflections(R-Free) 1570
    Percent Reflections(Observed) 98.15
    R-Factor(Observed) 0.1692
    R-Work 0.1679
    R-Free 0.2005
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 15.4172
    Anisotropic B[1][1] -0.917
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.2029
    Anisotropic B[2][2] -0.0099
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.9269
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.72
    Shell Resolution(Low) 1.7756
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3482
    R-Factor(R-Work) 0.2357
    R-Factor(R-Free) 0.2862
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7756
    Shell Resolution(Low) 1.839
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3462
    R-Factor(R-Work) 0.2041
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.839
    Shell Resolution(Low) 1.9127
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3474
    R-Factor(R-Work) 0.1804
    R-Factor(R-Free) 0.2354
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9127
    Shell Resolution(Low) 1.9997
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3481
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.2155
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9997
    Shell Resolution(Low) 2.1051
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3469
    R-Factor(R-Work) 0.1527
    R-Factor(R-Free) 0.184
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1051
    Shell Resolution(Low) 2.237
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3464
    R-Factor(R-Work) 0.1472
    R-Factor(R-Free) 0.1948
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.237
    Shell Resolution(Low) 2.4097
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3453
    R-Factor(R-Work) 0.1516
    R-Factor(R-Free) 0.186
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4097
    Shell Resolution(Low) 2.6522
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3439
    R-Factor(R-Work) 0.1552
    R-Factor(R-Free) 0.2089
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6522
    Shell Resolution(Low) 3.036
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3437
    R-Factor(R-Work) 0.1678
    R-Factor(R-Free) 0.1959
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.036
    Shell Resolution(Low) 3.8247
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3377
    R-Factor(R-Work) 0.1629
    R-Factor(R-Free) 0.1772
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8247
    Shell Resolution(Low) 48.2629
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 3406
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.1945
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.746
    f_plane_restr 0.005
    f_chiral_restr 0.076
    f_angle_d 1.146
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2745
    Nucleic Acid Atoms 0
    Heterogen Atoms 87
    Solvent Atoms 325
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction Xscale