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X-RAY DIFFRACTION
Materials and Methods page
4I7G
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.7
    Temperature 277.0
    Details 11% PEG 8000, 4% PEG 400, 50 mM imidazole, 10 mM spermine, 15 mM MgSO4, 100 mM ammonium sulfate, and 5 mM tris(2-carboxyethyl)phosphine, pH 6.7, VAPOR DIFFUSION, HANGING DROP, temperature 277.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 161.41 α = 90
    b = 73.14 β = 100.47
    c = 108.77 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2010-07-02
     
    Diffraction Radiation
    Monochromator SI 111 channel
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Wavelength List 0.918
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.85
    Resolution(Low) 43.3
    Number Reflections(All) 110875
    Number Reflections(Observed) 105443
    Percent Possible(Observed) 95.1
    R Merge I(Observed) 0.065
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.88
    Percent Possible(All) 86.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.854
    Resolution(Low) 43.297
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 104680
    Number of Reflections(Observed) 102628
    Number of Reflections(R-Free) 2052
    Percent Reflections(Observed) 97.03
    R-Factor(Observed) 0.183
    R-Work 0.1824
    R-Free 0.2096
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8539
    Shell Resolution(Low) 1.897
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 6050
    R-Factor(R-Work) 0.277
    R-Factor(R-Free) 0.3395
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.897
    Shell Resolution(Low) 1.9444
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 6453
    R-Factor(R-Work) 0.2489
    R-Factor(R-Free) 0.3045
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9444
    Shell Resolution(Low) 1.997
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6430
    R-Factor(R-Work) 0.2258
    R-Factor(R-Free) 0.2735
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.997
    Shell Resolution(Low) 2.0557
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 6559
    R-Factor(R-Work) 0.2104
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0557
    Shell Resolution(Low) 2.1221
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 6601
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2549
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1221
    Shell Resolution(Low) 2.1979
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 6704
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.1855
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1979
    Shell Resolution(Low) 2.2859
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6700
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2859
    Shell Resolution(Low) 2.39
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 6811
    R-Factor(R-Work) 0.1889
    R-Factor(R-Free) 0.2216
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.39
    Shell Resolution(Low) 2.516
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6836
    R-Factor(R-Work) 0.1909
    R-Factor(R-Free) 0.2547
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.516
    Shell Resolution(Low) 2.6736
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 6776
    R-Factor(R-Work) 0.1858
    R-Factor(R-Free) 0.2276
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6736
    Shell Resolution(Low) 2.88
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6811
    R-Factor(R-Work) 0.1826
    R-Factor(R-Free) 0.1897
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.88
    Shell Resolution(Low) 3.1697
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 6908
    R-Factor(R-Work) 0.1854
    R-Factor(R-Free) 0.2123
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1697
    Shell Resolution(Low) 3.6282
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6907
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6282
    Shell Resolution(Low) 4.5703
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6977
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.1737
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5703
    Shell Resolution(Low) 43.3083
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 7053
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.2067
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.099
    f_dihedral_angle_d 14.985
    f_angle_d 1.519
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7929
    Nucleic Acid Atoms 0
    Heterogen Atoms 82
    Solvent Atoms 668
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.8.1_1168)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHENIX version: (phenix.refine: 1.8.1_1168)
    data collection HKL-2000