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X-RAY DIFFRACTION
Materials and Methods page
4I78
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.5
    Temperature 295.0
    Details 0.1 M sodium citrate, pH 5.5, 1M LiCl2, and 15% PEG6000, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 100.82 α = 90
    b = 100.82 β = 90
    c = 760.54 γ = 120
     
    Space Group
    Space Group Name:    H 3 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-300
    Collection Date 2012-09-11
     
    Diffraction Radiation
    Monochromator Vertical Focusing Mirror: ultra-low expansion (ULE) titanium siliicate flat mirror with Pt, Uncoated, and Pd strips
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CLSI BEAMLINE 08ID-1
    Wavelength List 0.97949
    Site CLSI
    Beamline 08ID-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.18
    Resolution(Low) 50
    Number Reflections(Observed) 24997
    Percent Possible(Observed) 97.6
     
    High Resolution Shell Details
    Resolution(High) 3.18
    Resolution(Low) 3.27
    Percent Possible(All) 91.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.18
    Resolution(Low) 50.0
    Number of Reflections(Observed) 23738
    Number of Reflections(R-Free) 1249
    Percent Reflections(Observed) 96.12
    R-Factor(Observed) 0.20533
    R-Work 0.20253
    R-Free 0.25774
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 64.649
    Anisotropic B[1][1] 0.85
    Anisotropic B[1][2] 0.42
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.85
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.27
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.181
    Shell Resolution(Low) 3.264
    Number of Reflections(R-Free) 76
    Number of Reflections(R-Work) 1219
    R-Factor(R-Work) 0.301
    R-Factor(R-Free) 0.373
    Percent Reflections(Observed) 72.71
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_refined 0.006
    r_chiral_restr 0.104
    r_dihedral_angle_4_deg 17.68
    r_dihedral_angle_3_deg 19.57
    r_dihedral_angle_2_deg 38.153
    r_dihedral_angle_1_deg 7.265
    r_angle_refined_deg 1.656
    r_bond_refined_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7778
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building Phaser
    data collection HKL-2000