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X-RAY DIFFRACTION
Materials and Methods page
4I6V
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 297.0
    Details 0.1 HEPES:NaOH, 25% (w/v) PEG 3350, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 81.22 α = 90
    b = 111.25 β = 90
    c = 147.15 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirror
    Collection Date 2010-12-07
     
    Diffraction Radiation
    Monochromator Si 111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97915
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.14
    Resolution(Low) 46
    Number Reflections(All) 73652
    Number Reflections(Observed) 73652
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.112
    Redundancy 6.0
     
    High Resolution Shell Details
    Resolution(High) 2.15
    Resolution(Low) 2.19
    Percent Possible(All) 90.2
    R Merge I(Observed) 0.665
    Mean I Over Sigma(Observed) 2.6
    Redundancy 3.7
    Number Unique Reflections(All) 3289
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.137
    Resolution(Low) 45.893
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 73465
    Number of Reflections(Observed) 73465
    Number of Reflections(R-Free) 3711
    Percent Reflections(Observed) 98.58
    R-Factor(All) 0.1705
    R-Factor(Observed) 0.1705
    R-Work 0.1679
    R-Free 0.2181
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.5757
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.0944
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.5187
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1367
    Shell Resolution(Low) 2.1637
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2185
    R-Factor(R-Work) 0.2079
    R-Factor(R-Free) 0.3036
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1637
    Shell Resolution(Low) 2.1922
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2415
    R-Factor(R-Work) 0.2062
    R-Factor(R-Free) 0.2687
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1922
    Shell Resolution(Low) 2.2222
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2435
    R-Factor(R-Work) 0.2024
    R-Factor(R-Free) 0.2841
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2222
    Shell Resolution(Low) 2.254
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2501
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.3087
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.254
    Shell Resolution(Low) 2.2876
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2520
    R-Factor(R-Work) 0.204
    R-Factor(R-Free) 0.2426
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2876
    Shell Resolution(Low) 2.3233
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.2043
    R-Factor(R-Free) 0.2903
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3233
    Shell Resolution(Low) 2.3614
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.2125
    R-Factor(R-Free) 0.3199
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3614
    Shell Resolution(Low) 2.4022
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.199
    R-Factor(R-Free) 0.2532
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4022
    Shell Resolution(Low) 2.4458
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.2927
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4458
    Shell Resolution(Low) 2.4929
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.2521
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4929
    Shell Resolution(Low) 2.5438
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1914
    R-Factor(R-Free) 0.2782
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5438
    Shell Resolution(Low) 2.5991
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1881
    R-Factor(R-Free) 0.2526
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5991
    Shell Resolution(Low) 2.6595
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2572
    R-Factor(R-Work) 0.1881
    R-Factor(R-Free) 0.276
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6595
    Shell Resolution(Low) 2.726
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.1893
    R-Factor(R-Free) 0.2668
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.726
    Shell Resolution(Low) 2.7997
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.271
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7997
    Shell Resolution(Low) 2.8821
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1866
    R-Factor(R-Free) 0.2272
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8821
    Shell Resolution(Low) 2.9751
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9751
    Shell Resolution(Low) 3.0814
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2783
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0814
    Shell Resolution(Low) 3.2047
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.2371
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2047
    Shell Resolution(Low) 3.3506
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3506
    Shell Resolution(Low) 3.5271
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.2229
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5271
    Shell Resolution(Low) 3.748
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.1583
    R-Factor(R-Free) 0.2066
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.748
    Shell Resolution(Low) 4.0373
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1365
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0373
    Shell Resolution(Low) 4.4433
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1228
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4433
    Shell Resolution(Low) 5.0855
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.1192
    R-Factor(R-Free) 0.1615
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0855
    Shell Resolution(Low) 6.4044
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.1759
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4044
    Shell Resolution(Low) 45.9035
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.1767
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 14.119
    f_angle_d 1.072
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10347
    Nucleic Acid Atoms 0
    Heterogen Atoms 71
    Solvent Atoms 394
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-Collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    data collection SBC-Collect