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X-RAY DIFFRACTION
Materials and Methods page
4I6M
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 294.0
    Details 1.6 - 2.0 M Ammonium Phosphate, 0.1mM HEPES, pH 7.5, 1mM DTT, VAPOR DIFFUSION, SITTING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 227.37 α = 90
    b = 104.14 β = 93.78
    c = 81.32 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type PSI PILATUS 6M
    Details Si(111)
    Collection Date 2010-11-08
     
    Diffraction Radiation
    Monochromator Double silicon(111) crystal monochromator with cryogenically-cooled first crystal and sagittally-bent second crystal horizontally-focusing at 3.3:1 demagnification
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 0.979, 1.1
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.8
    Resolution(Low) 29.9
    Number Reflections(Observed) 46664
    Percent Possible(Observed) 98.16
    R Merge I(Observed) 0.51
    B(Isotropic) From Wilson Plot 77.3
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.86
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.032
    Mean I Over Sigma(Observed) 29.4
    Redundancy 4.1
    Number Unique Reflections(All) 4750
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.801
    Resolution(Low) 29.9
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 45768
    Number of Reflections(Observed) 45768
    Number of Reflections(R-Free) 2287
    Percent Reflections(Observed) 98.16
    R-Factor(All) 0.1865
    R-Factor(Observed) 0.1865
    R-Work 0.1845
    R-Free 0.2226
    R-Free Selection Details 5%
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.5688
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.3581
    Anisotropic B[2][2] 11.5406
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.9718
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8012
    Shell Resolution(Low) 2.8621
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2205
    R-Factor(R-Work) 0.3281
    R-Factor(R-Free) 0.4184
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8621
    Shell Resolution(Low) 2.9286
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2577
    R-Factor(R-Work) 0.303
    R-Factor(R-Free) 0.3682
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9286
    Shell Resolution(Low) 3.0018
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.2686
    R-Factor(R-Free) 0.3111
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0018
    Shell Resolution(Low) 3.0829
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.2519
    R-Factor(R-Free) 0.3027
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0829
    Shell Resolution(Low) 3.1735
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2742
    R-Factor(R-Work) 0.2254
    R-Factor(R-Free) 0.265
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1735
    Shell Resolution(Low) 3.2758
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.2169
    R-Factor(R-Free) 0.2421
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2758
    Shell Resolution(Low) 3.3927
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2780
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.2776
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3927
    Shell Resolution(Low) 3.5283
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.1823
    R-Factor(R-Free) 0.2531
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5283
    Shell Resolution(Low) 3.6887
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2774
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6887
    Shell Resolution(Low) 3.8827
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2760
    R-Factor(R-Work) 0.1669
    R-Factor(R-Free) 0.1873
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8827
    Shell Resolution(Low) 4.1254
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2769
    R-Factor(R-Work) 0.1505
    R-Factor(R-Free) 0.2034
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1254
    Shell Resolution(Low) 4.443
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2729
    R-Factor(R-Work) 0.1403
    R-Factor(R-Free) 0.1865
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.443
    Shell Resolution(Low) 4.8884
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2798
    R-Factor(R-Work) 0.1305
    R-Factor(R-Free) 0.1577
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8884
    Shell Resolution(Low) 5.5918
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5918
    Shell Resolution(Low) 7.03
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2814
    R-Factor(R-Work) 0.2071
    R-Factor(R-Free) 0.2515
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.03
    Shell Resolution(Low) 29.9644
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2835
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.202
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.08
    f_dihedral_angle_d 16.743
    f_angle_d 1.181
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7469
    Nucleic Acid Atoms 0
    Heterogen Atoms 60
    Solvent Atoms 91
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building SOLVE
    data collection CBASS