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X-RAY DIFFRACTION
Materials and Methods page
4I6L
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 293.0
    Details 0.2 M ammonium sulfate, 0.1 M MES, pH 6.5, and 20% (w/v) PEG8000, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.44 α = 90
    b = 109.07 β = 90
    c = 73.24 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 93
     
    Diffraction Detector
    Detector CCD
    Type DECTRIS PILATUS 6M
    Collection Date 2012-07-03
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Wavelength List 0.9795
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.4
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(All) 13269
    Number Reflections(Observed) 12681
     
    High Resolution Shell Details
    Resolution(High) 2.59
    Resolution(Low) 2.69
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.488
    Resolution(Low) 46.222
    Cut-off Sigma(F) 1.37
    Number of Reflections(all) 12681
    Number of Reflections(Observed) 12212
    Number of Reflections(R-Free) 580
    Percent Reflections(Observed) 91.52
    R-Factor(Observed) 0.2218
    R-Work 0.2197
    R-Free 0.2663
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.9516
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.2483
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.7033
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4877
    Shell Resolution(Low) 2.7381
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2133
    R-Factor(R-Work) 0.2667
    R-Factor(R-Free) 0.3026
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7381
    Shell Resolution(Low) 3.1342
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 3065
    R-Factor(R-Work) 0.2588
    R-Factor(R-Free) 0.3232
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1342
    Shell Resolution(Low) 3.9484
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3148
    R-Factor(R-Work) 0.2187
    R-Factor(R-Free) 0.2531
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9484
    Shell Resolution(Low) 46.23
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3286
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2401
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.053
    f_dihedral_angle_d 13.329
    f_angle_d 0.715
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2395
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 84
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building Phaser
    data collection HKL-2000