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X-RAY DIFFRACTION
Materials and Methods page
4I68
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 298.0
    Details 26% PEG8000, 0.1 M zinc acetate, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 25.16 α = 90
    b = 46.03 β = 90
    c = 59.61 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 2M-F
    Collection Date 2012-07-25
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength 1.009700
    Wavelength List 1
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.63
    Resolution(Low) 46.03
    Number Reflections(Observed) 9118
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.1526
    Redundancy 6.38
     
    High Resolution Shell Details
    Resolution(High) 1.63
    Resolution(Low) 1.72
    Percent Possible(All) 97.5
    R Merge I(Observed) 0.6347
    Mean I Over Sigma(Observed) 1.37
    R-Sym I(Observed) 0.6347
    Redundancy 3.98
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.63
    Resolution(Low) 36.432
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 9077
    Number of Reflections(R-Free) 419
    Percent Reflections(Observed) 99.41
    R-Factor(Observed) 0.1818
    R-Work 0.1793
    R-Free 0.2313
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.63
    Shell Resolution(Low) 1.8659
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2792
    R-Factor(R-Work) 0.2249
    R-Factor(R-Free) 0.2614
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8659
    Shell Resolution(Low) 2.3507
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2875
    R-Factor(R-Work) 0.1846
    R-Factor(R-Free) 0.2299
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3507
    Shell Resolution(Low) 36.4415
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2991
    R-Factor(R-Work) 0.1639
    R-Factor(R-Free) 0.2237
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.068
    f_dihedral_angle_d 12.677
    f_angle_d 1.149
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 680
    Nucleic Acid Atoms 0
    Heterogen Atoms 6
    Solvent Atoms 111
     
     
  •   Software and Computing Hide
    Computing
    Data Collection beamline software
    Data Reduction (intensity integration) XDS (VERSION September 26, 2012)
    Data Reduction (data scaling) SADABS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_1223)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1223)
    model building PHASER
    data collection beamline version: software