X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 298.0
Details 26% PEG8000, 0.1 M zinc acetate, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 25.16 α = 90
b = 46.03 β = 90
c = 59.61 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 2M-F -- 2012-07-25
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1 SLS X06DA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.63 46.03 99.4 0.1526 0.1526 -- 6.38 -- 9118 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.63 1.72 97.5 0.6347 0.6347 1.37 3.98 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.63 36.432 -- 1.34 -- 9077 419 99.41 -- 0.1818 0.1793 0.2313 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.63 1.8659 -- 131 2792 0.2249 0.2614 -- 99.0
X Ray Diffraction 1.8659 2.3507 -- 135 2875 0.1846 0.2299 -- 100.0
X Ray Diffraction 2.3507 36.4415 -- 153 2991 0.1639 0.2237 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.068
f_dihedral_angle_d 12.677
f_angle_d 1.149
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 680
Nucleic Acid Atoms 0
Heterogen Atoms 6
Solvent Atoms 111

Software

Computing
Computing Package Purpose
beamline software Data Collection
XDS (VERSION September 26, 2012) Data Reduction (intensity integration)
SADABS Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: dev_1223) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: dev_1223) refinement
PHASER model building
beamline version: software data collection