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X-RAY DIFFRACTION
Materials and Methods page
4I67
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 298.0
    Details 1.06 M sodium malonate, pH 6.0, 0.1 M Tris-HCl, pH 7.5, 0.13 M potassium/sodium phosphate, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 88.43 α = 90
    b = 88.43 β = 90
    c = 28.94 γ = 120
     
    Space Group
    Space Group Name:    P 61
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-06-21
     
    Diffraction Radiation
    Monochromator double crystal Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength 0.99997
    Wavelength List 1
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.33
    Resolution(Low) 44.2
    Number Reflections(Observed) 5963
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.052
    Redundancy 9.76
     
    High Resolution Shell Details
    Resolution(High) 2.33
    Resolution(Low) 2.43
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.868
    Mean I Over Sigma(Observed) 1.2
    R-Sym I(Observed) 0.868
    Redundancy 9.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.33
    Resolution(Low) 38.293
    Cut-off Sigma(F) 1.38
    Number of Reflections(Observed) 5726
    Number of Reflections(R-Free) 260
    Percent Reflections(Observed) 99.91
    R-Factor(Observed) 0.1794
    R-Work 0.1769
    R-Free 0.2338
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.33
    Shell Resolution(Low) 2.9358
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.272
    R-Factor(R-Free) 0.3757
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9358
    Shell Resolution(Low) 38.2986
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2764
    R-Factor(R-Work) 0.162
    R-Factor(R-Free) 0.2136
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.062
    f_dihedral_angle_d 16.066
    f_angle_d 1.064
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 585
    Nucleic Acid Atoms 94
    Heterogen Atoms 0
    Solvent Atoms 11
     
     
  •   Software and Computing Hide
    Computing
    Data Collection beamline software
    Data Reduction (intensity integration) XDS (VERSION March 15, 2012)
    Data Reduction (data scaling) SADABS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection beamline version: software