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X-RAY DIFFRACTION
Materials and Methods page
4I62
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 298.0
    Details 0.1 M HEPES pH 7.0, 30% Jeffamine ED-2001 pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.68 α = 90
    b = 55.03 β = 114.09
    c = 46.67 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2012-10-12
     
    Diffraction Radiation
    Monochromator C(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-G
    Wavelength List 0.9786
    Site APS
    Beamline 21-ID-G
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -2.0
    Resolution(High) 1.05
    Resolution(Low) 30
    Number Reflections(Observed) 91003
    Percent Possible(Observed) 99.2
    Redundancy 6.5
     
    High Resolution Shell Details
    Resolution(High) 1.05
    Resolution(Low) 1.07
    Percent Possible(All) 94.2
    Mean I Over Sigma(Observed) 2.58
    R-Sym I(Observed) 0.607
    Redundancy 5.1
    Number Unique Reflections(All) 4332
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method Molecular Replacement
    reflnsShellList 1.05
    Resolution(Low) 23.072
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 90970
    Number of Reflections(R-Free) 1999
    Percent Reflections(Observed) 99.1
    R-Factor(Observed) 0.1662
    R-Work 0.1659
    R-Free 0.1793
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0502
    Shell Resolution(Low) 1.0765
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 5983
    R-Factor(R-Work) 0.2657
    R-Factor(R-Free) 0.2949
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.0765
    Shell Resolution(Low) 1.1056
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 6368
    R-Factor(R-Work) 0.2331
    R-Factor(R-Free) 0.2563
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1056
    Shell Resolution(Low) 1.1381
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6352
    R-Factor(R-Work) 0.2059
    R-Factor(R-Free) 0.2229
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1381
    Shell Resolution(Low) 1.1749
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6365
    R-Factor(R-Work) 0.1925
    R-Factor(R-Free) 0.1867
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1749
    Shell Resolution(Low) 1.2169
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6411
    R-Factor(R-Work) 0.1823
    R-Factor(R-Free) 0.1961
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2169
    Shell Resolution(Low) 1.2656
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 6405
    R-Factor(R-Work) 0.1759
    R-Factor(R-Free) 0.1927
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2656
    Shell Resolution(Low) 1.3232
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6343
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.2073
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3232
    Shell Resolution(Low) 1.3929
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 6435
    R-Factor(R-Work) 0.1713
    R-Factor(R-Free) 0.1705
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3929
    Shell Resolution(Low) 1.4802
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 6389
    R-Factor(R-Work) 0.1646
    R-Factor(R-Free) 0.1926
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4802
    Shell Resolution(Low) 1.5944
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 6397
    R-Factor(R-Work) 0.1559
    R-Factor(R-Free) 0.1847
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5944
    Shell Resolution(Low) 1.7549
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6418
    R-Factor(R-Work) 0.1556
    R-Factor(R-Free) 0.1738
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7549
    Shell Resolution(Low) 2.0087
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6425
    R-Factor(R-Work) 0.157
    R-Factor(R-Free) 0.1898
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0087
    Shell Resolution(Low) 2.5302
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6459
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.1624
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5302
    Shell Resolution(Low) 23.0779
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6221
    R-Factor(R-Work) 0.1606
    R-Factor(R-Free) 0.1617
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.093
    f_dihedral_angle_d 13.655
    f_angle_d 1.457
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1812
    Nucleic Acid Atoms 0
    Heterogen Atoms 14
    Solvent Atoms 337
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution PHENIX (phenix.autosol)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHENIX version: (phenix.autosol)
    data collection HKL-3000